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Paper Abstract and Keywords
Presentation 2010-11-29 11:20
A Consideration of Substrate Noise Sensitivity of Analog Elements
Satoshi Takaya, Yoji Bando, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) CPM2010-126 ICD2010-85
Abstract (in Japanese) (See Japanese page) 
(in English) Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometory and operating conditions. Substrate sensitivity has a relation with the signal gain, and the output resistance value of the tail current source.
Keyword (in Japanese) (See Japanese page) 
(in English) mixedsignal VLSI / substrate crosstalk / on-chip monitor / / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 315, ICD2010-85, pp. 13-17, Nov. 2010.
Paper # ICD2010-85 
Date of Issue 2010-11-22 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2010-126 ICD2010-85

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2010-11-29 - 2010-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2010 ―New Field of VLSI Design― 
Paper Information
Registration To ICD 
Conference Code 2010-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Consideration of Substrate Noise Sensitivity of Analog Elements 
Sub Title (in English)  
Keyword(1) mixedsignal VLSI  
Keyword(2) substrate crosstalk  
Keyword(3) on-chip monitor  
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1st Author's Name Satoshi Takaya  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Yoji Bando  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Takashi Hasegawa  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Toru Ohkawa  
4th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
5th Author's Name Masaaki Souda  
5th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
6th Author's Name Toshiharu Takaramoto  
6th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
7th Author's Name Toshio Yamada  
7th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
8th Author's Name Shigetaka Kumashiro  
8th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
9th Author's Name Tohru Mogami  
9th Author's Affiliation MIRAI-Selete (MIRAI-Selete)
10th Author's Name Makoto Nagata  
10th Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2010-11-29 11:20:00 
Presentation Time 20 minutes 
Registration for ICD 
Paper # CPM2010-126, ICD2010-85 
Volume (vol) vol.110 
Number (no) no.314(CPM), no.315(ICD) 
Page pp.13-17 
#Pages 5 
Date of Issue 2010-11-22 (CPM, ICD) 

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