Paper Abstract and Keywords |
Presentation |
2010-11-29 11:20
A Consideration of Substrate Noise Sensitivity of Analog Elements Satoshi Takaya, Yoji Bando, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) CPM2010-126 ICD2010-85 Link to ES Tech. Rep. Archives: CPM2010-126 ICD2010-85 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometory and operating conditions. Substrate sensitivity has a relation with the signal gain, and the output resistance value of the tail current source. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
mixedsignal VLSI / substrate crosstalk / on-chip monitor / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 315, ICD2010-85, pp. 13-17, Nov. 2010. |
Paper # |
ICD2010-85 |
Date of Issue |
2010-11-22 (CPM, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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CPM2010-126 ICD2010-85 Link to ES Tech. Rep. Archives: CPM2010-126 ICD2010-85 |
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