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Paper Abstract and Keywords
Presentation 2010-12-10 14:05
An Immunity Test Method Insensitive to Arrangements of Equipment Under Test for Indirect Discharges of ESD-Gun onto Tapered Vertical Coupling Plane
Takuro Tsuji, Kouji Himeno (NIT), Yoshinori Taka (KNCT), Osamu Fujiwara (NIT) EMCJ2010-92
Abstract (in Japanese) (See Japanese page) 
(in English) International Electrotechnical Commission (IEC) prescribes immunity tests (IEC61000-4-2) of electronic equipment against electrostatic discharge (ESDs), and specifies indirect discharges of an ESD gun onto a vertical coupling plane (VCP) in the vicinity of equipment under test (EUT) for simulating personal discharges to conductive materials being adjacent to the EUT. According to IEC 61000-4-2 2008-04, the VCP shall be placed at a distance of 0.1m from the EUT, and the indirect discharges of an ESD gun should be conducted to the centre of a vertical edge of the VCP, though the reference arrangement of EUT is not specifically determined. In the previous study, we measured electromagnetic fields due to indirect discharges of an ESD gun onto a VCP to investigate their variations with respect to EUT positions, which showed that indirect discharges onto a vertical edge from the back side of a VCP are very likely to reduce the above-mentioned variations, while the induced voltage levels become low. In the present study, to improve this problem, we used a tapered VCP in lieu of the IEC-specified VCP, and by using a magnetic field probe in place of EUT, we measured its induced voltages for indirect discharges of an ESD gun onto the VCP, and examined the variations in peaks and waveform energies with respect to the probe positions. As a result, we found that the tapered VCP suppresses the variations in peaks by 60% and waveform energies by 50% compared to the IEC specified VCP.
Keyword (in Japanese) (See Japanese page) 
(in English) ESD / IEC standard / Indirect discharges / tapered vertical coupling plane / induced voltages / variations / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 332, EMCJ2010-92, pp. 63-67, Dec. 2010.
Paper # EMCJ2010-92 
Date of Issue 2010-12-03 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ IEE-EMC  
Conference Date 2010-12-10 - 2010-12-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Chukyo Univ. Toyoda Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electric Power, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2010-12-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Immunity Test Method Insensitive to Arrangements of Equipment Under Test for Indirect Discharges of ESD-Gun onto Tapered Vertical Coupling Plane 
Sub Title (in English)  
Keyword(1) ESD  
Keyword(2) IEC standard  
Keyword(3) Indirect discharges  
Keyword(4) tapered vertical coupling plane  
Keyword(5) induced voltages  
Keyword(6) variations  
Keyword(7)  
Keyword(8)  
1st Author's Name Takuro Tsuji  
1st Author's Affiliation Nagoya Institute of Technology (NIT)
2nd Author's Name Kouji Himeno  
2nd Author's Affiliation Nagoya Institute of Technology (NIT)
3rd Author's Name Yoshinori Taka  
3rd Author's Affiliation Kushiro National College of Technology (KNCT)
4th Author's Name Osamu Fujiwara  
4th Author's Affiliation Nagoya Institute of Technology (NIT)
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Speaker Author-1 
Date Time 2010-12-10 14:05:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2010-92 
Volume (vol) vol.110 
Number (no) no.332 
Page pp.63-67 
#Pages 5 
Date of Issue 2010-12-03 (EMCJ) 

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