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| Presentation | 2010-12-16 15:10 [Poster Presentation] Evaluation of power noise in SRAM core Taku Toshikawa, Tsubasa Masui, Takuya Sawada, Makoto Nagata (Kobe Univ.)  ICD2010-112 Link to ES Tech. Rep. Archives: ICD2010-112 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Power noise of SRAM operation is evaluated with a test chip fabricated in a 90-nm CMOS technology. The chip includes on-die voltage monitors, BIST structures for failure bit detection and analysis, and a set of SRAM macros with different bit and word specifications. Power and ground noise waveforms are measured and compared in a variety of operation conditions in both user and BIST modes. It is found that power noise depends on an operating frequency of memory, in terms of their average and amplitudes. We are challenging to relate power noise and bit failures, by using automatic measurement systems of power noise, bit error rate, and fail bit map. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | SRAM / power noise / on-die voltage monitors / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 344, ICD2010-112, pp. 85-88, Dec. 2010. | |
| Paper # | ICD2010-112 | |
| Date of Issue | 2010-12-09 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2010-112 Link to ES Tech. Rep. Archives: ICD2010-112 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2010-12-16 - 2010-12-17 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | RCAST, Univ. of Tokyo |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Workshop for Graduate Student and Young Researchers |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2010-12-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of power noise in SRAM core |
| Sub Title (in English) | * |
| Keyword(1) | SRAM |
| Keyword(2) | power noise |
| Keyword(3) | on-die voltage monitors |
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| 1st Author's Name | Taku Toshikawa |
| 1st Author's Affiliation | Kobe University (Kobe Univ.) |
| 2nd Author's Name | Tsubasa Masui |
| 2nd Author's Affiliation | Kobe University (Kobe Univ.) |
| 3rd Author's Name | Takuya Sawada |
| 3rd Author's Affiliation | Kobe University (Kobe Univ.) |
| 4th Author's Name | Makoto Nagata |
| 4th Author's Affiliation | Kobe University (Kobe Univ.) |
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| Speaker | Author-1 |
| Date Time | 2010-12-16 15:10:00 |
| Presentation Time | 120 minutes |
| Registration for | ICD |
| Paper # | ICD2010-112 |
| Volume (vol) | vol.110 |
| Number (no) | no.344 |
| Page | pp.85-88 |
| #Pages | 4 |
| Date of Issue | 2010-12-09 (ICD) |
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