Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-02-14 10:25
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors
Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60
Abstract (in Japanese) (See Japanese page) 
(in English) Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
Keyword (in Japanese) (See Japanese page) 
(in English) At-speed testing / ATPG / Low-power-test / Capture-safety checking / / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 413, DC2010-60, pp. 7-12, Feb. 2011.
Paper # DC2010-60 
Date of Issue 2011-02-07 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2010-60

Conference Information
Committee DC  
Conference Date 2011-02-14 - 2011-02-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2011-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors 
Sub Title (in English)  
Keyword(1) At-speed testing  
Keyword(2) ATPG  
Keyword(3) Low-power-test  
Keyword(4) Capture-safety checking  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ryota Sakai  
1st Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
2nd Author's Name Kohei Miyase  
2nd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
3rd Author's Name Xiaoqing Wen  
3rd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
4th Author's Name Masao Aso  
4th Author's Affiliation Renesas Micro Systems Co., Ltd. (RMS)
5th Author's Name Hiroshi Furukawa  
5th Author's Affiliation Renesas Micro Systems (RMS)
6th Author's Name Yuta Yamato  
6th Author's Affiliation Fukuoka Industry, Science & Technology Fundation (Fukuoka Ind. Sci & Tech/Fundation FIST)
7th Author's Name Seiji Kajihara  
7th Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech.)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2011-02-14 10:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2010-60 
Volume (vol) vol.110 
Number (no) no.413 
Page pp.7-12 
#Pages 6 
Date of Issue 2011-02-07 (DC) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan