Paper Abstract and Keywords |
Presentation |
2011-02-14 10:25
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
At-speed testing / ATPG / Low-power-test / Capture-safety checking / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 413, DC2010-60, pp. 7-12, Feb. 2011. |
Paper # |
DC2010-60 |
Date of Issue |
2011-02-07 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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DC2010-60 |
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