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Paper Abstract and Keywords
Presentation 2011-02-18 15:00
Detection of degradation sign of LSI operation using IDDQ
Shunsuke Sakamoto, Masaru Sanada (KUT) R2010-46 EMD2010-147
Abstract (in Japanese) (See Japanese page) 
(in English) VDD supply current (IDDQ) information has been applied to detect LSI evaluation technology, IDDQ which has high fault detection sensitivity comparison with logic information. We used the IDDQ data to confirm degradation sign of LSI operation. For identification of early degradation with tiny leakage current, and clear detection of leakage current value growth brought with degradation progress, mathematical analysis way is worked. The technology is that data between test vector number versus IDDQ value is converted by Fourier transformation and is fabricated to power spectrum, which actualizes degradation sign. As a result, progress from tiny change of about 1/1000 on normal value was measured. Controversial points are discussed for prediction times of circuit operation down.
Keyword (in Japanese) (See Japanese page) 
(in English) IDDQ / LSI / Degradation / Fourier Transformation / Power spectrum / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 415, R2010-46, pp. 25-30, Feb. 2011.
Paper # R2010-46 
Date of Issue 2011-02-11 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2010-46 EMD2010-147

Conference Information
Committee EMD R  
Conference Date 2011-02-18 - 2011-02-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Shizuoka Univ. (Hamamatsu) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2011-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Detection of degradation sign of LSI operation using IDDQ 
Sub Title (in English)  
Keyword(1) IDDQ  
Keyword(2) LSI  
Keyword(3) Degradation  
Keyword(4) Fourier Transformation  
Keyword(5) Power spectrum  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shunsuke Sakamoto  
1st Author's Affiliation Kochi University of Technology (KUT)
2nd Author's Name Masaru Sanada  
2nd Author's Affiliation Kochi University of Technology (KUT)
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Speaker Author-1 
Date Time 2011-02-18 15:00:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2010-46, EMD2010-147 
Volume (vol) vol.110 
Number (no) no.415(R), no.416(EMD) 
Page pp.25-30 
#Pages 6 
Date of Issue 2011-02-11 (R, EMD) 

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