Paper Abstract and Keywords |
Presentation |
2011-02-23 16:55
Capacitance measurements of sub-micron Al junctions using SQUID resonance Kento Kikuchi, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (Univ. of Electro-Comm.) ED2010-199 SDM2010-234 Link to ES Tech. Rep. Archives: ED2010-199 SDM2010-234 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
It is necessary to extract the capacitances, resistances and inductances experimentally for fabrication sub-micron Al junction device. We have obtained these device parameters using SQUID resonance techniques with sub-micron Al junctions evaluated by means of direct current injections. The results of capacitance are 54~170fF/μm2 . |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Superconductor / Josephson-Junction / SQUID / tunnel junction / inductance / capacitance / / |
Reference Info. |
IEICE Tech. Rep., vol. 110, no. 423, ED2010-199, pp. 43-48, Feb. 2011. |
Paper # |
ED2010-199 |
Date of Issue |
2011-02-16 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ED2010-199 SDM2010-234 Link to ES Tech. Rep. Archives: ED2010-199 SDM2010-234 |
Conference Information |
Committee |
SDM ED |
Conference Date |
2011-02-23 - 2011-02-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hokkaido Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Functional nanodevices and related technologies |
Paper Information |
Registration To |
ED |
Conference Code |
2011-02-SDM-ED |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Capacitance measurements of sub-micron Al junctions using SQUID resonance |
Sub Title (in English) |
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Keyword(1) |
Superconductor |
Keyword(2) |
Josephson-Junction |
Keyword(3) |
SQUID |
Keyword(4) |
tunnel junction |
Keyword(5) |
inductance |
Keyword(6) |
capacitance |
Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Kento Kikuchi |
1st Author's Affiliation |
The University of Electro-Communications (Univ. of Electro-Comm.) |
2nd Author's Name |
Masataka Moriya |
2nd Author's Affiliation |
The University of Electro-Communications (Univ. of Electro-Comm.) |
3rd Author's Name |
Hiroshi Shimada |
3rd Author's Affiliation |
The University of Electro-Communications (Univ. of Electro-Comm.) |
4th Author's Name |
Yoshinao Mizugaki |
4th Author's Affiliation |
The University of Electro-Communications (Univ. of Electro-Comm.) |
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Speaker |
Author-1 |
Date Time |
2011-02-23 16:55:00 |
Presentation Time |
25 minutes |
Registration for |
ED |
Paper # |
ED2010-199, SDM2010-234 |
Volume (vol) |
vol.110 |
Number (no) |
no.423(ED), no.424(SDM) |
Page |
pp.43-48 |
#Pages |
6 |
Date of Issue |
2011-02-16 (ED, SDM) |
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