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Paper Abstract and Keywords
Presentation 2011-06-24 14:40
[Invited Talk] International Conference Report - VTS2011(29th IEEE VLSI Test Symposium)
Kazumi Hatayama (NAIST) DC2011-11
Abstract (in Japanese) (See Japanese page) 
(in English) This talk provide a report of VTS2011 (29th IEEE VLSI Test Symposium), which was held in Dana Point, California, USA, in May, 2011. After showing the outline of VTS and VTS2011, the trend of paper topic area is given. Then the summaries of keynote speech and invited talks are followed by detailed reports on noticeable papers in the areas of silicon debug, utilization of on-chip sensors, low power test and design for testability.
Keyword (in Japanese) (See Japanese page) 
(in English) silicon debug / on-chip sensor / low power test / design for testability / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 100, DC2011-11, pp. 17-22, June 2011.
Paper # DC2011-11 
Date of Issue 2011-06-17 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Notes on Review This article is a technical report without peer review, and its polished version will be published elsewhere.
Download PDF DC2011-11

Conference Information
Committee DC  
Conference Date 2011-06-24 - 2011-06-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design, Test, Verification 
Paper Information
Registration To DC 
Conference Code 2011-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) International Conference Report - VTS2011(29th IEEE VLSI Test Symposium) 
Sub Title (in English)  
Keyword(1) silicon debug  
Keyword(2) on-chip sensor  
Keyword(3) low power test  
Keyword(4) design for testability  
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1st Author's Name Kazumi Hatayama  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2011-06-24 14:40:00 
Presentation Time 60 minutes 
Registration for DC 
Paper # DC2011-11 
Volume (vol) vol.111 
Number (no) no.100 
Page pp.17-22 
#Pages 6 
Date of Issue 2011-06-17 (DC) 

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