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| Paper Abstract and Keywords | ||
| Presentation | 2011-06-24 13:00 An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults Satoshi Fukumoto, Masayuki Arai, Shinya Hara, Kazuhiko Iwasaki (TMU)  DC2011-8 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this paper, we analyze the distribution of fault coverage in random-pattern testing. We introduce a stochastic variable that maps the events of detection and non-detection of each fault in a random-pattern testing into the integers 1 and 0 respectively. Based on this variable, we establish a stochastic evaluation model and numerically show that mean and variance of fault coverage distribution can be estimated precisely from the anaytical results. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | fault coverage / ramdom-pattern testing / stochastic model / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 100, DC2011-8, pp. 1-4, June 2011. | |
| Paper # | DC2011-8 | |
| Date of Issue | 2011-06-17 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Notes on Review | This article is a technical report without peer review, and its polished version will be published elsewhere. | |
| Download PDF | DC2011-8 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2011-06-24 - 2011-06-24 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design, Test, Verification |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2011-06-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults |
| Sub Title (in English) | |
| Keyword(1) | fault coverage |
| Keyword(2) | ramdom-pattern testing |
| Keyword(3) | stochastic model |
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| 1st Author's Name | Satoshi Fukumoto |
| 1st Author's Affiliation | Tokyo Metropolitan University (TMU) |
| 2nd Author's Name | Masayuki Arai |
| 2nd Author's Affiliation | Tokyo Metropolitan University (TMU) |
| 3rd Author's Name | Shinya Hara |
| 3rd Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University (TMU) |
| 4th Author's Name | Kazuhiko Iwasaki |
| 4th Author's Affiliation | Tokyo Metropolitan University (TMU) |
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| Speaker | Author-2 |
| Date Time | 2011-06-24 13:00:00 |
| Presentation Time | 30 minutes |
| Registration for | DC |
| Paper # | DC2011-8 |
| Volume (vol) | vol.111 |
| Number (no) | no.100 |
| Page | pp.1-4 |
| #Pages | 4 |
| Date of Issue | 2011-06-17 (DC) |
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