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Paper Abstract and Keywords
Presentation 2011-10-06 14:35
A Study of Electromagnetic Modeling of GSG Probes for On-Wafer Measurement
Takuichi Hirano, Kenichi Okada, Jiro Hirokawa, Makoto Ando (Tokyo Tech) EST2011-67
Abstract (in Japanese) (See Japanese page) 
(in English) On-chip analog RF circuits are measured using GSG probes by contacting them onto pads. Electromagnetic simulation modeling including pads is sometimes necessary. The authors had reported electromagnetic simulation modeling for excitations using GSG pads with symmetric circuit, and the validity was confirmed by measurement. In this report, the previous work is extended, and electromagnetic simulation modeling for the circuit without symmetry is investigated.
Keyword (in Japanese) (See Japanese page) 
(in English) Electromagnetic Analysis Modeling / GSG Probe / Pad / On-Wafer Measurement / Millimeter-Wave / CMOS / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 224, EST2011-67, pp. 15-20, Oct. 2011.
Paper # EST2011-67 
Date of Issue 2011-09-29 (EST) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EST2011-67

Conference Information
Committee EST  
Conference Date 2011-10-06 - 2011-10-07 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagasaki Prefectural Art Museum 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EST 
Conference Code 2011-10-EST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study of Electromagnetic Modeling of GSG Probes for On-Wafer Measurement 
Sub Title (in English)  
Keyword(1) Electromagnetic Analysis Modeling  
Keyword(2) GSG Probe  
Keyword(3) Pad  
Keyword(4) On-Wafer Measurement  
Keyword(5) Millimeter-Wave  
Keyword(6) CMOS  
Keyword(7)  
Keyword(8)  
1st Author's Name Takuichi Hirano  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
2nd Author's Name Kenichi Okada  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
3rd Author's Name Jiro Hirokawa  
3rd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
4th Author's Name Makoto Ando  
4th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
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Speaker Author-1 
Date Time 2011-10-06 14:35:00 
Presentation Time 25 minutes 
Registration for EST 
Paper # EST2011-67 
Volume (vol) vol.111 
Number (no) no.224 
Page pp.15-20 
#Pages 6 
Date of Issue 2011-09-29 (EST) 

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