Paper Abstract and Keywords |
Presentation |
2011-10-20 11:30
A Study on Sequential Circuits Tolerating for Transient Faults in a Highly Electromagnetic Environment Aromhack Saysanasongkham, Kenta Imai, Yoshifumi Koyama, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2011-21 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Recently, research on miniaturizing and densifying the power converter circuit are showing significant progressions. Consequently, control circuit and gate driver circuit are getting extremely close to the high current main circuit. Thus the electro-magnetic radiation generated nearby the high current pulse may affect the control circuit and the neighboring circuits as transient faults. In this paper we propose a fault-tolerant sequential circuit, which can tolerate periodic transient faults due to electromagnetic radiation caused by DC-AC inverters. The proposed circuit repeatedly applies functional BIST to measure the duration of a transient fault, and then appropriately negates clock signals during normal operation to avoid the effects of the faults. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
transient fault tolerant circuit / on-line functional BIST / electromagnetic radiation / DC-AC inverter / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 252, DC2011-21, pp. 7-11, Oct. 2011. |
Paper # |
DC2011-21 |
Date of Issue |
2011-10-13 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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DC2011-21 |
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