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Paper Abstract and Keywords
Presentation 2011-10-20 11:30
A Study on Sequential Circuits Tolerating for Transient Faults in a Highly Electromagnetic Environment
Aromhack Saysanasongkham, Kenta Imai, Yoshifumi Koyama, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2011-21
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, research on miniaturizing and densifying the power converter circuit are showing significant progressions. Consequently, control circuit and gate driver circuit are getting extremely close to the high current main circuit. Thus the electro-magnetic radiation generated nearby the high current pulse may affect the control circuit and the neighboring circuits as transient faults. In this paper we propose a fault-tolerant sequential circuit, which can tolerate periodic transient faults due to electromagnetic radiation caused by DC-AC inverters. The proposed circuit repeatedly applies functional BIST to measure the duration of a transient fault, and then appropriately negates clock signals during normal operation to avoid the effects of the faults.
Keyword (in Japanese) (See Japanese page) 
(in English) transient fault tolerant circuit / on-line functional BIST / electromagnetic radiation / DC-AC inverter / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 252, DC2011-21, pp. 7-11, Oct. 2011.
Paper # DC2011-21 
Date of Issue 2011-10-13 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2011-21

Conference Information
Committee DC  
Conference Date 2011-10-20 - 2011-10-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2011-10-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on Sequential Circuits Tolerating for Transient Faults in a Highly Electromagnetic Environment 
Sub Title (in English)  
Keyword(1) transient fault tolerant circuit  
Keyword(2) on-line functional BIST  
Keyword(3) electromagnetic radiation  
Keyword(4) DC-AC inverter  
Keyword(5)  
Keyword(6)  
Keyword(7)  
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1st Author's Name Aromhack Saysanasongkham  
1st Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
2nd Author's Name Kenta Imai  
2nd Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
3rd Author's Name Yoshifumi Koyama  
3rd Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
4th Author's Name Masayuki Arai  
4th Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
5th Author's Name Satoshi Fukumoto  
5th Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
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Speaker Author-1 
Date Time 2011-10-20 11:30:00 
Presentation Time 30 minutes 
Registration for DC 
Paper # DC2011-21 
Volume (vol) vol.111 
Number (no) no.252 
Page pp.7-11 
#Pages 5 
Date of Issue 2011-10-13 (DC) 

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