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Paper Abstract and Keywords
Presentation 2011-10-25 09:55
Near Infrared Reflected Intensity Based Material Recognition and Its Application
Muhammad Attamimi, Tomoaki Nakamura, Takayuki Nagai (UEC Tokyo) SIP2011-69 ICD2011-72 IE2011-68
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, near\--infrared (NIR) reflection intensity acquired from TOF camera is used for material recognition. Generally, NIR reflection intensity is determined by irradiation intensity, the reflectance factor of surface, incident angle and the distance to the object for diffuse reflection occurred on an object's surface. Since TOF camera is a device that can capture the depth of target object, the distance to the surface of target object and the information of normal direction can be measured from it. Therefore, it is possible to estimate the reflectance factor of surface if irradiation intensity is constant. Since the direct estimation of reflectivity coefficient is not needed, the distance to the object, incident angle and reflection intensity are utilized as a feature and multiple SVMs based learning of each material is employed in order to realize material recognition. Moreover, reflection intensity based material recognition is applied and the realization of cleaning task by autonomous mobile robot is considered.
Keyword (in Japanese) (See Japanese page) 
(in English) material recognition / near-infrared reflection intensity / TOF camera / object detection / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 257, SIP2011-69, pp. 43-48, Oct. 2011.
Paper # SIP2011-69 
Date of Issue 2011-10-17 (SIP, ICD, IE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SIP2011-69 ICD2011-72 IE2011-68

Conference Information
Committee ICD IE SIP IPSJ-SLDM  
Conference Date 2011-10-24 - 2011-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Ｉｃｈｉｎｏｂｏ(Sendai) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SIP 
Conference Code 2011-10-ICD-IE-SIP-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Near Infrared Reflected Intensity Based Material Recognition and Its Application 
Sub Title (in English)  
Keyword(1) material recognition  
Keyword(2) near-infrared reflection intensity  
Keyword(3) TOF camera  
Keyword(4) object detection  
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1st Author's Name Muhammad Attamimi  
1st Author's Affiliation The University of Electro-Communications (UEC Tokyo)
2nd Author's Name Tomoaki Nakamura  
2nd Author's Affiliation The University of Electro-Communications (UEC Tokyo)
3rd Author's Name Takayuki Nagai  
3rd Author's Affiliation The University of Electro-Communications (UEC Tokyo)
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Speaker Author-1 
Date Time 2011-10-25 09:55:00 
Presentation Time 25 minutes 
Registration for SIP 
Paper # SIP2011-69, ICD2011-72, IE2011-68 
Volume (vol) vol.111 
Number (no) no.257(SIP), no.258(ICD), no.259(IE) 
Page pp.43-48 
#Pages 6 
Date of Issue 2011-10-17 (SIP, ICD, IE) 

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