| Paper Abstract and Keywords |
| Presentation |
2011-11-17 17:10
Ultraviolet Photodetectors using Transparent Gate AlGaN/GaN-HEMT Tomotaka Narita, Akio Wakejima, Takashi Egawa (NIT) ED2011-86 CPM2011-135 LQE2011-109 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Transparent gate AlGaN/GaN HEMT(High Electron Mobility Transistor) on a Si substrate was fabricated. We estimated as characteristics of DC and UV detectors by UV and visible light irradiation from the surface side. A significant drain current increase and a negative threshold-voltage shift occurred by UV light irradiation. Thus photogenerated carriers under transparent gate electrode were observed. The gate electrode enabled the device to operate under pinch-off conditions, resulted in low dark current. A high responsivity of 3×105A/W at 200μW/cm2 under a wavelength of 360nm was obtained. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
GaN / AlGaN / HEMT / UV photodetectors / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 111, no. 290, ED2011-86, pp. 67-70, Nov. 2011. |
| Paper # |
ED2011-86 |
| Date of Issue |
2011-11-10 (ED, CPM, LQE) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
ED2011-86 CPM2011-135 LQE2011-109 |
| Conference Information |
| Committee |
LQE ED CPM |
| Conference Date |
2011-11-17 - 2011-11-18 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Katsura Hall,Kyoto Univ. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
ED |
| Conference Code |
2011-11-LQE-ED-CPM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Ultraviolet Photodetectors using Transparent Gate AlGaN/GaN-HEMT |
| Sub Title (in English) |
|
| Keyword(1) |
GaN |
| Keyword(2) |
AlGaN |
| Keyword(3) |
HEMT |
| Keyword(4) |
UV photodetectors |
| Keyword(5) |
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| 1st Author's Name |
Tomotaka Narita |
| 1st Author's Affiliation |
Nagoya Institute of Technology (NIT) |
| 2nd Author's Name |
Akio Wakejima |
| 2nd Author's Affiliation |
Nagoya Institute of Technology (NIT) |
| 3rd Author's Name |
Takashi Egawa |
| 3rd Author's Affiliation |
Nagoya Institute of Technology (NIT) |
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| Speaker |
Author-1 |
| Date Time |
2011-11-17 17:10:00 |
| Presentation Time |
25 minutes |
| Registration for |
ED |
| Paper # |
ED2011-86, CPM2011-135, LQE2011-109 |
| Volume (vol) |
vol.111 |
| Number (no) |
no.290(ED), no.291(CPM), no.292(LQE) |
| Page |
pp.67-70 |
| #Pages |
4 |
| Date of Issue |
2011-11-10 (ED, CPM, LQE) |