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Paper Abstract and Keywords
Presentation 2011-12-16 10:30
Automatic defect classification using Bag-of-Keypoints
Tsutomu Sakuyama, Akira Matsumura (SCREEN) PRMU2011-134
Abstract (in Japanese) (See Japanese page) 
(in English) Bag-of-Keypoints(BoK) is an algorithm for image classification. The BoK is based on Scale-Invariant Feature Transform (SIFT) which is an algorithm for deteting keypoints and extracting local feature descriptors. In this paper, we proposed a novel approach for Automatic defect classification (ADC) using BoK. First, to remove a noise in the image, we used a background removing technique. Secondly, to detect the keypoints on subject in the image, we fix the SIFT parameter that is a best value for increasing the number of keyopints. In the result, we could classified the image at the same level as human in factory line.
Keyword (in Japanese) (See Japanese page) 
(in English) Bag-of-Keypoints / SIFT / ADC / 半導体 / SVM / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 353, PRMU2011-134, pp. 53-58, Dec. 2011.
Paper # PRMU2011-134 
Date of Issue 2011-12-08 (PRMU) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PRMU2011-134

Conference Information
Committee PRMU FM  
Conference Date 2011-12-15 - 2011-12-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Hamamatsu Campus, Shizuoka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To PRMU 
Conference Code 2011-12-PRMU-FM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Automatic defect classification using Bag-of-Keypoints 
Sub Title (in English)  
Keyword(1) Bag-of-Keypoints  
Keyword(2) SIFT  
Keyword(3) ADC  
Keyword(4) 半導体  
Keyword(5) SVM  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tsutomu Sakuyama  
1st Author's Affiliation DAINIPPON SCREEN MFG. CO., LTD. (SCREEN)
2nd Author's Name Akira Matsumura  
2nd Author's Affiliation DAINIPPON SCREEN MFG. CO., LTD. (SCREEN)
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Speaker Author-1 
Date Time 2011-12-16 10:30:00 
Presentation Time 30 minutes 
Registration for PRMU 
Paper # PRMU2011-134 
Volume (vol) vol.111 
Number (no) no.353 
Page pp.53-58 
#Pages 6 
Date of Issue 2011-12-08 (PRMU) 

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