Paper Abstract and Keywords |
Presentation |
2012-01-12 12:50
Analusis of Buffer-Impurity and Field-Plate Effects on Breakdown Performance in Small-Sized AlGaN/GaN HEMTs Hiraku Onodera, Atsushi Nakajima, Kazushige Horio (Shibaura Inst. Tech.) ED2011-133 MW2011-156 Link to ES Tech. Rep. Archives: ED2011-133 MW2011-156 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this work, we perform two-dimensional analysis of breakdown characteristics in field-plate AlGaN/GaN HEMTs with a short gate length and a short gate-to-drain distance. It is shown that when an acceptor density in a buffer layer is high, the breakdown voltage is determined by impact ionization of carriers, and it can decrease with increasing the field-plate length. On the other hand, when the acceptor density in the buffer layer is low, the buffer leakage current becomes very large and this can determine the breakdown voltage, which becomes very low. In this case, the breakdown voltage increases with increasing the field-plate length. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
GaN / HEMT / field plate / breakdown voltage / buffer trap / two-dimensional analysis / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 373, ED2011-133, pp. 81-85, Jan. 2012. |
Paper # |
ED2011-133 |
Date of Issue |
2012-01-04 (ED, MW) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ED2011-133 MW2011-156 Link to ES Tech. Rep. Archives: ED2011-133 MW2011-156 |
Conference Information |
Committee |
ED MW |
Conference Date |
2012-01-11 - 2012-01-12 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
|
Paper Information |
Registration To |
ED |
Conference Code |
2012-01-ED-MW |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analusis of Buffer-Impurity and Field-Plate Effects on Breakdown Performance in Small-Sized AlGaN/GaN HEMTs |
Sub Title (in English) |
|
Keyword(1) |
GaN |
Keyword(2) |
HEMT |
Keyword(3) |
field plate |
Keyword(4) |
breakdown voltage |
Keyword(5) |
buffer trap |
Keyword(6) |
two-dimensional analysis |
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Hiraku Onodera |
1st Author's Affiliation |
Shibaura Institute of Technology (Shibaura Inst. Tech.) |
2nd Author's Name |
Atsushi Nakajima |
2nd Author's Affiliation |
Shibaura Institute of Technology (Shibaura Inst. Tech.) |
3rd Author's Name |
Kazushige Horio |
3rd Author's Affiliation |
Shibaura Institute of Technology (Shibaura Inst. Tech.) |
4th Author's Name |
|
4th Author's Affiliation |
() |
5th Author's Name |
|
5th Author's Affiliation |
() |
6th Author's Name |
|
6th Author's Affiliation |
() |
7th Author's Name |
|
7th Author's Affiliation |
() |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2012-01-12 12:50:00 |
Presentation Time |
25 minutes |
Registration for |
ED |
Paper # |
ED2011-133, MW2011-156 |
Volume (vol) |
vol.111 |
Number (no) |
no.373(ED), no.374(MW) |
Page |
pp.81-85 |
#Pages |
5 |
Date of Issue |
2012-01-04 (ED, MW) |
|