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Paper Abstract and Keywords
Presentation 2012-02-08 11:00
Seebeck Coefficient of Ultrathin Si with Fermi Energy Controlled by External Bias
Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda (Shizuoka Univ.) ED2011-153 SDM2011-170
Abstract (in Japanese) (See Japanese page) 
(in English) We varied the Seebeck coefficient of an n-type silicon-on-insulator (SOI) sample by applying an external bias in order to control the Fermi energy of the SOI layer without the formation of impurity band. The Seebeck coefficient became increasingly negative with increasing positive external bias. This result qualitatively agrees with the characteristic of P-doped SOI layers because the positive bias reduces the Fermi energy of the SOI at the SOI/buried-oxide interface and reduces the electron concentration. Consequently, the Fermi energy can be controlled by controlling the external bias, which modifies the Seebeck coefficient of the SOI sample.
Keyword (in Japanese) (See Japanese page) 
(in English) Seebeck coefficient / nanostructure / impurity-band formation / Fermi energy / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 426, SDM2011-170, pp. 65-69, Feb. 2012.
Paper # SDM2011-170 
Date of Issue 2012-01-31 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2011-153 SDM2011-170

Conference Information
Committee ED SDM  
Conference Date 2012-02-07 - 2012-02-08 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SDM 
Conference Code 2012-02-ED-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Seebeck Coefficient of Ultrathin Si with Fermi Energy Controlled by External Bias 
Sub Title (in English)  
Keyword(1) Seebeck coefficient  
Keyword(2) nanostructure  
Keyword(3) impurity-band formation  
Keyword(4) Fermi energy  
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Keyword(6)  
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1st Author's Name Faiz Salleh  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Kazutoshi Miwa  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name Hiroya Ikeda  
3rd Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker Author-1 
Date Time 2012-02-08 11:00:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # ED2011-153, SDM2011-170 
Volume (vol) vol.111 
Number (no) no.425(ED), no.426(SDM) 
Page pp.65-69 
#Pages 5 
Date of Issue 2012-01-31 (ED, SDM) 

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