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| Presentation | 2012-02-08 09:55 Simultaneous Control of Series-Connected Nanogaps by Field-Emission-Induced Electromigration Mitsuki Ito, Shunsuke Akimoto, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.)  ED2011-151 SDM2011-168 Link to ES Tech. Rep. Archives: ED2011-151 SDM2011-168 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We present a simple and easy technique for the simultaneous control of electrical properties of multiple Ni nanogaps. This technique is based on electromigration induced by a field emission current, which is so-called ‘‘activation’’. The tuning of tunnel resistance of nanogaps was simultaneously achieved by passing a Fowler-Nordheim (F-N) field emission current through three initial Ni nanogaps connected in series. The Ni nanogaps having an asymmetrical shape with an initial gap separation of a few tens of nm were fabricated by electron-beam (EB) lithography and lift-off process. By performing the activation, current-voltage properties of series-connected nanogaps were simultaneously varied from ‘‘insulating’’ to ‘‘metallic’’ through ‘‘tunneling’’ properties with increasing the preset current of the activation. Furthermore, the tunnel resistance, which is defined as the resistance in the low-voltage regime, was measured after performing the activation at room temperature. The tunnel resistance of simultaneously activated nanogaps decreased from the order of 100 TΩ to 100 kΩ with increasing the preset current from 1 nA to 30 μA. These results clearly indicate that the electrical properties of series-connected nanogaps can be simultaneously tuned by the activation procedure, despite the difference in the samples having different initial nanogap separation distances. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electromigration / field emission current / nanogap / single-electron transistor / integration / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 425, ED2011-151, pp. 53-58, Feb. 2012. | |
| Paper # | ED2011-151 | |
| Date of Issue | 2012-01-31 (ED, SDM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ED2011-151 SDM2011-168 Link to ES Tech. Rep. Archives: ED2011-151 SDM2011-168 |
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| Conference Information | |
| Committee | ED SDM |
| Conference Date | 2012-02-07 - 2012-02-08 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ED |
| Conference Code | 2012-02-ED-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Simultaneous Control of Series-Connected Nanogaps by Field-Emission-Induced Electromigration |
| Sub Title (in English) | |
| Keyword(1) | electromigration |
| Keyword(2) | field emission current |
| Keyword(3) | nanogap |
| Keyword(4) | single-electron transistor |
| Keyword(5) | integration |
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| 1st Author's Name | Mitsuki Ito |
| 1st Author's Affiliation | Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.) |
| 2nd Author's Name | Shunsuke Akimoto |
| 2nd Author's Affiliation | Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.) |
| 3rd Author's Name | Jun-ichi Shirakashi |
| 3rd Author's Affiliation | Tokyo University of Agriculture and Technology (Tokyo Univ. of Agr. & Tech.) |
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| Speaker | Author-1 |
| Date Time | 2012-02-08 09:55:00 |
| Presentation Time | 25 minutes |
| Registration for | ED |
| Paper # | ED2011-151, SDM2011-168 |
| Volume (vol) | vol.111 |
| Number (no) | no.425(ED), no.426(SDM) |
| Page | pp.53-58 |
| #Pages | 6 |
| Date of Issue | 2012-01-31 (ED, SDM) |
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