Paper Abstract and Keywords |
Presentation |
2012-02-13 11:05
Pattern Merging for Additional Path Delay Fault Detection with Transition Delay Fault Test Hiroaki Tanaka, Kohei Miyase, Kazunari Enokimoto, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2011-78 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this paper, we present to generate a test vector set to detect both transition and path delay faults. The proposed method detects the most path delay faults possible via transition delay tests without test data inflation. Experimental results for ITC’99 benchmark circuits demonstrate that the proposed method can detect many path delay faults in addition to transition delay faults with transition delay tests. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
transition delay fault / path delay fault / X-filling / X-identification / test generation / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 435, DC2011-78, pp. 13-18, Feb. 2012. |
Paper # |
DC2011-78 |
Date of Issue |
2012-02-06 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2011-78 |
Conference Information |
Committee |
DC |
Conference Date |
2012-02-13 - 2012-02-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2012-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Pattern Merging for Additional Path Delay Fault Detection with Transition Delay Fault Test |
Sub Title (in English) |
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Keyword(1) |
transition delay fault |
Keyword(2) |
path delay fault |
Keyword(3) |
X-filling |
Keyword(4) |
X-identification |
Keyword(5) |
test generation |
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Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Hiroaki Tanaka |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
2nd Author's Name |
Kohei Miyase |
2nd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
3rd Author's Name |
Kazunari Enokimoto |
3rd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
4th Author's Name |
Xiaoqing Wen |
4th Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
5th Author's Name |
Seiji Kajihara |
5th Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
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Speaker |
Author-1 |
Date Time |
2012-02-13 11:05:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2011-78 |
Volume (vol) |
vol.111 |
Number (no) |
no.435 |
Page |
pp.13-18 |
#Pages |
6 |
Date of Issue |
2012-02-06 (DC) |