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Paper Abstract and Keywords
Presentation 2012-05-30 16:20
[Invited Talk] How to Mitigate Reliability-related Issues on Nano-scaled LSIs
Kazutoshi Kobayashi (KIT) VLD2012-5
Abstract (in Japanese) (See Japanese page) 
(in English) According to aggressive process scaling, reliability issues on
semiconductor devices are becoming dominant such as variability,
temporal failure and aging degradation. Variability is related to the
device fabrication process. Timing margins at design time should be
enlarged as the fluctuation of transistor performance. It may diminish
the performance enhancement from process scaling. Temporal failures
are mainly caused by alpha particles from packages or neutrons from
outer space. These particles generate electron-hole pairs to flip
memory or flip-flops, which is so-called soft errors. Redundant
circuits are commonly utilized to mitigate soft errors. Aging
degradation is mainly caused by BTI (Bias Temperature Instability). In
BTI, transistors are degraded or recovered according to the stress
history on the gate bias. We introduce several mitigation techniques
based on the measurement results.
Keyword (in Japanese) (See Japanese page) 
(in English) Reliability / Variability / Soft Error / Temporal Failure / Aging Degradation / BTI / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 71, VLD2012-5, pp. 25-30, May 2012.
Paper # VLD2012-5 
Date of Issue 2012-05-23 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee IPSJ-SLDM VLD  
Conference Date 2012-05-30 - 2012-05-31 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitakyushu International Conference Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) System Design, etc. 
Paper Information
Registration To VLD 
Conference Code 2012-05-SLDM-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) How to Mitigate Reliability-related Issues on Nano-scaled LSIs 
Sub Title (in English)  
Keyword(1) Reliability  
Keyword(2) Variability  
Keyword(3) Soft Error  
Keyword(4) Temporal Failure  
Keyword(5) Aging Degradation  
Keyword(6) BTI  
1st Author's Name Kazutoshi Kobayashi  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2012-05-30 16:20:00 
Presentation Time 60 minutes 
Registration for VLD 
Paper # VLD2012-5 
Volume (vol) vol.112 
Number (no) no.71 
Page pp.25-30 
Date of Issue 2012-05-23 (VLD) 

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