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Paper Abstract and Keywords
Presentation 2012-06-22 15:00
Flashover Voltage Properties between Foil Conductors on Printed Wiring Board for ESD Surge by Xenon Lump Irradiation
Kotaro Tsuboi, Sho Iwai, Shinya Ohtsuka (KIT) EMCJ2012-29
Abstract (in Japanese) (See Japanese page) 
(in English) Flashover voltages(FOVs) between foil conductors on printed wiring board(PWB) by electrostatic discharge(ESD)have a dispersion even at the same condition test. This dispersion could be caused by probabilities of initial electron generation(statistical time lag) and/or discharge development(formative time lag). In order to understand the FOV properties and develop the electronic devices with high immunity for ESD, it is important to the improve the repeatability of FO test. In this paper, we investigated FOV properties between foil conductors on PWB by xenon（Xe）lump irradiation. As a result, it was found that σ decreased to step ΔV(=0.1kV) and V50 also decreases by 20% by Xe lump irradiation. V50 agreed with the Paschen curve below the g=1.0mm, and trend of the Toepler's equation over g=1.0mm.
Keyword (in Japanese) (See Japanese page) 
(in English) Electrostatic discharge / Printed wiring board / Flashover / Xenon lump / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 100, EMCJ2012-29, pp. 49-52, June 2012.
Paper # EMCJ2012-29 
Date of Issue 2012-06-15 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ IEE-EMC  
Conference Date 2012-06-22 - 2012-06-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC 
Paper Information
Registration To EMCJ 
Conference Code 2012-06-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Flashover Voltage Properties between Foil Conductors on Printed Wiring Board for ESD Surge by Xenon Lump Irradiation 
Sub Title (in English)  
Keyword(1) Electrostatic discharge  
Keyword(2) Printed wiring board  
Keyword(3) Flashover  
Keyword(4) Xenon lump  
Keyword(5)  
Keyword(6)  
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1st Author's Name Kotaro Tsuboi  
1st Author's Affiliation Kyushu Institute of Technology (KIT)
2nd Author's Name Sho Iwai  
2nd Author's Affiliation Kyushu Institute of Technology (KIT)
3rd Author's Name Shinya Ohtsuka  
3rd Author's Affiliation Kyushu Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2012-06-22 15:00:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2012-29 
Volume (vol) vol.112 
Number (no) no.100 
Page pp.49-52 
#Pages 4 
Date of Issue 2012-06-15 (EMCJ) 

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