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Paper Abstract and Keywords
Presentation 2012-06-22 16:10
On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing
Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue (NAIST) DC2012-15
Abstract (in Japanese) (See Japanese page) 
(in English) It is well known that dynamic IR-drop analysis consumes large amount of time even for a few clock cycles. This paper addresses this issue with a novel per-cell dynamic IR-drop estimation method. Instead of performing time-consuming IR-drop analysis for each clock cycle one by one, the proposed method uses global cycle average power profile for each cycle and dynamic IR-drop profiles for a few representative cycles, thus total computation time is effectively reduced. Experimental results on a benchmark circuit demonstrate that the proposed method achieves both high accuracy and high time-efficiency.
Keyword (in Japanese) (See Japanese page) 
(in English) IR-drop / Scan testing / Test-induced yield loss / / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 102, DC2012-15, pp. 39-44, June 2012.
Paper # DC2012-15 
Date of Issue 2012-06-15 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2012-15

Conference Information
Committee DC  
Conference Date 2012-06-22 - 2012-06-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Room B3-1 Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design, Test, Verification 
Paper Information
Registration To DC 
Conference Code 2012-06-DC 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing 
Sub Title (in English)  
Keyword(1) IR-drop  
Keyword(2) Scan testing  
Keyword(3) Test-induced yield loss  
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1st Author's Name Yuta Yamato  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Tomokazu Yoneda  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Kazumi Hatayama  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Michiko Inoue  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2012-06-22 16:10:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2012-15 
Volume (vol) vol.112 
Number (no) no.102 
Page pp.39-44 
#Pages 6 
Date of Issue 2012-06-15 (DC) 

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