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Paper Abstract and Keywords
Presentation 2012-06-22 16:35
Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test
Yousuke Miyake, Takuma Sasakawa, Yasuo Sato, Seiji Kajihara (Kyutech), Yukiya Miura (TMU) DC2012-16
Abstract (in Japanese) (See Japanese page) 
(in English) Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, highly accurate delay measurement that considers the influence by temperature and voltage is strongly needed. Therefore, we developed a TEG, in which ring-oscillator-based monitoring circuits are embedded, and evaluated on-chip temperature and voltage using the monitor circuits. In this paper, we discuss the issues and solutions field for test by using the evaluation results of the chip.
Keyword (in Japanese) (See Japanese page) 
(in English) Aging / Field test / Temperature and Voltage monitor / Ring Oscillator / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 102, DC2012-16, pp. 45-50, June 2012.
Paper # DC2012-16 
Date of Issue 2012-06-15 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2012-16

Conference Information
Committee DC  
Conference Date 2012-06-22 - 2012-06-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Room B3-1 Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design, Test, Verification 
Paper Information
Registration To DC 
Conference Code 2012-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test 
Sub Title (in English)  
Keyword(1) Aging  
Keyword(2) Field test  
Keyword(3) Temperature and Voltage monitor  
Keyword(4) Ring Oscillator  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yousuke Miyake  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Takuma Sasakawa  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
3rd Author's Name Yasuo Sato  
3rd Author's Affiliation Kyushu Institute of Technology (Kyutech)
4th Author's Name Seiji Kajihara  
4th Author's Affiliation Kyushu Institute of Technology (Kyutech)
5th Author's Name Yukiya Miura  
5th Author's Affiliation Tokyo Metropolitan University (TMU)
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Speaker Author-1 
Date Time 2012-06-22 16:35:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2012-16 
Volume (vol) vol.112 
Number (no) no.102 
Page pp.45-50 
#Pages 6 
Date of Issue 2012-06-15 (DC) 

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