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Paper Abstract and Keywords
Presentation 2012-06-22 13:50
A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test
Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2012-11
Abstract (in Japanese) (See Japanese page) 
(in English) In the BIST (built-in self-test) scheme, the occurrence of faults in BIST circuits, such as TPGs (test pattern generators) and test response analyzers,
may cause unreliable testing of chips, so that it results in field defects and yield loss.
If BIST circuits are fault-tolerant, faulty BIST circuits behave as fault-free ones.
As a result, testing of chips becomes more reliable.
In this paper, we propose two novel fault-tolerant TPGs for reliable BIST,
and discuss the reliability of not only the two fault-tolerant TPGs but also the repairable TPG[10] under the assumption where permanent or transient faults exist in the TPGs.
Experimental results show that the proposed TPGs are effective under the assumption of permanent faults and transient faults, respectively.
Keyword (in Japanese) (See Japanese page) 
(in English) Built-in self-test / fault tolerance / test pattern generators / reliable test / cyclic code / reliability model / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 102, DC2012-11, pp. 15-20, June 2012.
Paper # DC2012-11 
Date of Issue 2012-06-15 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2012-11

Conference Information
Committee DC  
Conference Date 2012-06-22 - 2012-06-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Room B3-1 Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design, Test, Verification 
Paper Information
Registration To DC 
Conference Code 2012-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test 
Sub Title (in English)  
Keyword(1) Built-in self-test  
Keyword(2) fault tolerance  
Keyword(3) test pattern generators  
Keyword(4) reliable test  
Keyword(5) cyclic code  
Keyword(6) reliability model  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuki Fukazawa  
1st Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
2nd Author's Name Tsuyoshi Iwagaki  
2nd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
3rd Author's Name Hideyuki Ichihara  
3rd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
4th Author's Name Tomoo Inoue  
4th Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
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Speaker Author-1 
Date Time 2012-06-22 13:50:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2012-11 
Volume (vol) vol.112 
Number (no) no.102 
Page pp.15-20 
#Pages 6 
Date of Issue 2012-06-15 (DC) 

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