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Paper Abstract and Keywords
Presentation
2012-06-29 10:45
[Invited Talk] Decomposition analysis of on-current variability of FinFETs
Takashi Matsukawa
,
Yongxun Liu
,
Kazuhiko Endo
,
Shinichi O'uchi
,
Meishoku Masahara
(
AIST
)
Abstract
(in Japanese)
(See Japanese page)
(in English)
(Not available yet)
Keyword
(in Japanese)
(See Japanese page)
(in English)
/ / / / / / /
Reference Info.
IEICE Tech. Rep.
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Conference Information
Committee
SDM ED
Conference Date
2012-06-27 - 2012-06-29
Place (in Japanese)
(See Japanese page)
Place (in English)
Okinawa Seinen-kaikan
Topics (in Japanese)
(See Japanese page)
Topics (in English)
2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
Paper Information
Registration To
SDM
Conference Code
2012-06-SDM-ED
Language
English
Title (in Japanese)
(See Japanese page)
Sub Title (in Japanese)
(See Japanese page)
Title (in English)
Decomposition analysis of on-current variability of FinFETs
Sub Title (in English)
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1st Author's Name
Takashi Matsukawa
1st Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
2nd Author's Name
Yongxun Liu
2nd Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
3rd Author's Name
Kazuhiko Endo
3rd Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
4th Author's Name
Shinichi O'uchi
4th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
5th Author's Name
Meishoku Masahara
5th Author's Affiliation
National Institute of Advanced Industrial Science and Technology
(
AIST
)
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Speaker
Author-1
Date Time
2012-06-29 10:45:00
Presentation Time
30 minutes
Registration for
SDM
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Volume (vol)
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Page
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