IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-09-07 15:40
A simulation model of bulk current injection (BCI) test
Hiroya Tanaka, Atsuhiro Takahashi, Yoshiyuki Hattori (Toyota Central R&D Labs.), Masato Izumichi (DENSO CORPORATION) EMCJ2012-60
Abstract (in Japanese) (See Japanese page) 
(in English) BCI test is used to evaluate a noise immunity of in-vehicle electronic
equipment. To predict an injected current into the equipment and to
improve the noise immunity during a design stage, a simulation model of
the BCI test is desired. In this report, we propose a new modeling
method for simulating the injected current of the test. The test system
consists of (1) a current-injection probe, (2) harnesses, and (3)
equipment, which are modeled as an ideal transformer and impedance
matrixes. The whole system model is obtained by connecting these
models. Here, the simulation and an experiment were carried out for the
BCI test using 50 ohm loads instead of the DUT. The simulation results
of injected current spectrums agreed with the experimental ones. From
these results, this model can be useful for the prediction of injected
current spectrum at each terminal of the DUT.
Keyword (in Japanese) (See Japanese page) 
(in English) Bulk current injection test / Simulation model / Coupled analysis / Immunity / In-vehicle electronic equipment / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 201, EMCJ2012-60, pp. 47-50, Sept. 2012.
Paper # EMCJ2012-60 
Date of Issue 2012-08-31 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2012-60

Conference Information
Committee EMCJ  
Conference Date 2012-09-07 - 2012-09-07 
Place (in Japanese) (See Japanese page) 
Place (in English) Hkkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Biomedical EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2012-09-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A simulation model of bulk current injection (BCI) test 
Sub Title (in English)  
Keyword(1) Bulk current injection test  
Keyword(2) Simulation model  
Keyword(3) Coupled analysis  
Keyword(4) Immunity  
Keyword(5) In-vehicle electronic equipment  
1st Author's Name Hiroya Tanaka  
1st Author's Affiliation Toyota Central R&D Labs. (Toyota Central R&D Labs.)
2nd Author's Name Atsuhiro Takahashi  
2nd Author's Affiliation Toyota Central R&D Labs. (Toyota Central R&D Labs.)
3rd Author's Name Yoshiyuki Hattori  
3rd Author's Affiliation Toyota Central R&D Labs. (Toyota Central R&D Labs.)
4th Author's Name Masato Izumichi  
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2012-09-07 15:40:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2012-60 
Volume (vol) vol.112 
Number (no) no.201 
Page pp.47-50 
Date of Issue 2012-08-31 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan