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| Presentation | 2012-12-14 16:00 A Test Generation Model for Over-testing Alleviation and Its Application to Testing Based on Fault Acceptability Masaaki Sakurada, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (HCU)  DC2012-77 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Over-testing, which is to judge fault-free chips as faulty ones, is a cause of the decrease in the effective yield of chips. In this paper, we propose a test generation model, called selective test generation model, in order to alleviate over-testing. Using this model with a general test generation algorithm can generate test patterns that not only detect target faults but also do not detect faults to be avoided being detected. Moreover, we discuss an application of this model to testing based on fault acceptability, which is defied according to error rate. We formulate two test generation problems for acceptable faults and give an approximate algorithm employing the proposed model to solve one of them. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Over-testing / acceptable faults / test generation / error rate / transformation / test generation model / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 362, DC2012-77, pp. 21-26, Dec. 2012. | |
| Paper # | DC2012-77 | |
| Date of Issue | 2012-12-07 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2012-77 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2012-12-14 - 2012-12-14 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Aossa (Fukui) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Safety, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2012-12-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Generation Model for Over-testing Alleviation and Its Application to Testing Based on Fault Acceptability |
| Sub Title (in English) | |
| Keyword(1) | Over-testing |
| Keyword(2) | acceptable faults |
| Keyword(3) | test generation |
| Keyword(4) | error rate |
| Keyword(5) | transformation |
| Keyword(6) | test generation model |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Masaaki Sakurada |
| 1st Author's Affiliation | HIroshima City University (HCU) |
| 2nd Author's Name | Hideyuki Ichihara |
| 2nd Author's Affiliation | HIroshima City University (HCU) |
| 3rd Author's Name | Tsuyoshi Iwagaki |
| 3rd Author's Affiliation | HIroshima City University (HCU) |
| 4th Author's Name | Tomoo Inoue |
| 4th Author's Affiliation | HIroshima City University (HCU) |
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| Speaker | Author-1 |
| Date Time | 2012-12-14 16:00:00 |
| Presentation Time | 30 minutes |
| Registration for | DC |
| Paper # | DC2012-77 |
| Volume (vol) | vol.112 |
| Number (no) | no.362 |
| Page | pp.21-26 |
| #Pages | 6 |
| Date of Issue | 2012-12-07 (DC) |
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