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Paper Abstract and Keywords
Presentation 2012-12-18 10:20
28-nm HKMG GHz Digital Sensor for Detecting Dynamic Voltage Drops in Testing for Peak Power Optimization
Mitsuhiko Igarashi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita, Kan Takeuchi (Renesas Electronics) ICD2012-115
Abstract (in Japanese) (See Japanese page) 
(in English) We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.
Keyword (in Japanese) (See Japanese page) 
(in English) test / dynamic voltage drop / activity rate / voltage drop sensor / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 365, ICD2012-115, pp. 97-102, Dec. 2012.
Paper # ICD2012-115 
Date of Issue 2012-12-10 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2012-115

Conference Information
Committee ICD  
Conference Date 2012-12-17 - 2012-12-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Tech Front 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2012-12-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) 28-nm HKMG GHz Digital Sensor for Detecting Dynamic Voltage Drops in Testing for Peak Power Optimization 
Sub Title (in English)  
Keyword(1) test  
Keyword(2) dynamic voltage drop  
Keyword(3) activity rate  
Keyword(4) voltage drop sensor  
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1st Author's Name Mitsuhiko Igarashi  
1st Author's Affiliation Renesas Electronics corporation (Renesas Electronics)
2nd Author's Name Yoshio Takazawa  
2nd Author's Affiliation Renesas Electronics corporation (Renesas Electronics)
3rd Author's Name Yasuto Igarashi  
3rd Author's Affiliation Renesas Electronics corporation (Renesas Electronics)
4th Author's Name Hiroaki Matsushita  
4th Author's Affiliation Renesas Electronics corporation (Renesas Electronics)
5th Author's Name Kan Takeuchi  
5th Author's Affiliation Renesas Electronics corporation (Renesas Electronics)
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Speaker Author-1 
Date Time 2012-12-18 10:20:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2012-115 
Volume (vol) vol.112 
Number (no) no.365 
Page pp.97-102 
#Pages 6 
Date of Issue 2012-12-10 (ICD) 

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