Paper Abstract and Keywords |
Presentation |
2012-12-18 11:40
High Frequency Performance of GaAsSb/InAlAs/InGaAs Tunnel Diodes Mikhail Patrashin, Norihiko Sekine, Akifumi Kasamatsu, Issei Watanabe, Iwao Hosako (NICT), Tsuyoshi Takahashi, Masaru Sato, Yasuhiro Nakasha, Naoki Hara (Fujitsu Lab.) ED2012-106 Link to ES Tech. Rep. Archives: ED2012-106 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Increasing interest to high-resolution active and passive MMW-THz imaging and high-speed wireless data communications motivates development of novel devices and systems operating beyond 100 GHz. Among various detector technologies, zero-bias heterostructure tunnel diodes based on III-V compound semiconductors have promising characteristics, such as reduced 1/f noise, higher operational frequencies due to small device capacitances, and feasibility of monolithic integration of the detectors with low noise amplifier (LNA) circuits. We evaluated performance of InP-based, zero-bias, square-law GaAsSb/InAlAs/InGaAs tunnel diodes for direct detection at frequencies up to 330 GHz. The detectors with submicron cross-sectional area demonstrated sensitivities above 500 V/W. Optimization of the device structure can improve the sensitivity and the cut-off frequency. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Semiconductor heterostructures / tunnel diodes / millimeter wave detectors / millimeter wave imaging / MMICs / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 364, ED2012-106, pp. 75-76, Dec. 2012. |
Paper # |
ED2012-106 |
Date of Issue |
2012-12-10 (ED) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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ED2012-106 Link to ES Tech. Rep. Archives: ED2012-106 |
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