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Presentation 2013-01-24 15:16
Characterization of InGaN Quantum Wells by Two-Wavelength Excited Photoluminescence
Naoki Murakoshi, A. Z. M. Touhidul Islam, Takeshi Fukuda, Norihiko Kamata (Saitama Univ.), Yasuhiko Arakawa (Univ. Tokyo) EID2012-21 Link to ES Tech. Rep. Archives: EID2012-21
Abstract (in Japanese) (See Japanese page) 
(in English) We investigated below-gap levels acting as non-radiative (NRR) centers in MOCVD-grown In0.16Ga0.84N/ In0.02Ga0.98N Quantum well (QW) structures. A method of Two-wavelength Excited Photoluminescence (PL) has been applied as a non-destructive, and a non-contacting spectroscopy without electrode, together with a time-resolved PL. With increasing the below-gap excitation intensity, the PL from the well layer increased, while that from barrier and GaN layers decreased. This implies that several NRR centers activated by the BGE energy of 1.17eV exist inside the forbidden gap of the QW, showing a possibility of analyzing carrier recombination mechanism quantitatively.
Keyword (in Japanese) (See Japanese page) 
(in English) InGaN / Quantum well structure / Non-radiative recombination center / Two-wavelength excited photoluminescence / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 409, EID2012-21, pp. 49-52, Jan. 2013.
Paper # EID2012-21 
Date of Issue 2013-01-17 (EID) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2012-21 Link to ES Tech. Rep. Archives: EID2012-21

Conference Information
Committee ITE-IDY EID IEE-EDD  
Conference Date 2013-01-24 - 2013-01-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Shizuoka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EID 
Conference Code 2013-01-IDY-EID-EDD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characterization of InGaN Quantum Wells by Two-Wavelength Excited Photoluminescence 
Sub Title (in English)  
Keyword(1) InGaN  
Keyword(2) Quantum well structure  
Keyword(3) Non-radiative recombination center  
Keyword(4) Two-wavelength excited photoluminescence  
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1st Author's Name Naoki Murakoshi  
1st Author's Affiliation Saitama University (Saitama Univ.)
2nd Author's Name A. Z. M. Touhidul Islam  
2nd Author's Affiliation Saitama University (Saitama Univ.)
3rd Author's Name Takeshi Fukuda  
3rd Author's Affiliation Saitama University (Saitama Univ.)
4th Author's Name Norihiko Kamata  
4th Author's Affiliation Saitama University (Saitama Univ.)
5th Author's Name Yasuhiko Arakawa  
5th Author's Affiliation University of Tokyo (Univ. Tokyo)
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Speaker Author-1 
Date Time 2013-01-24 15:16:00 
Presentation Time 8 minutes 
Registration for EID 
Paper # EID2012-21 
Volume (vol) vol.112 
Number (no) no.409 
Page pp.49-52 
#Pages
Date of Issue 2013-01-17 (EID) 


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