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Paper Abstract and Keywords
Presentation 2013-03-04 14:40
Self-Compensation of Manufacturing Variability using On-Chip Sensors
Yuma Higuchi, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2012-138
Abstract (in Japanese) (See Japanese page) 
(in English) Manufacturing variability is becoming more influential on circuit performance and parametric yield, and is predicted to get much severer according to device miniaturization. To improve the circuit performance after fabrication and sustain parametric yield, several adaptation methods using voltage scaling and adaptive body biasing have been proposed. However, most of these methods require prohibitively large tuning cost, because they adjust performance by repeating tests to check if timing constraints are met. This work focuses on a self-compensation method for manufacturing variability, which requires less adjustment cost. In addition, we present a self-tuning method giving a combination of voltage scaling and body biasing, which minimizes power consumption while satisfying timing constraints on the basis of estimated device-parameter variation. Assuming a case that variation parameters could be perfectly estimated, the mean value $\mu$ of power consumption is reduced by 9.3\% to 32.1\%, and the worst-case value $\mu+3\sigma$ is reduced by 0.5\% to 53.5\% compared to voltage scaling and body biasing. We also investigate the impact of sensor accuracy on parametric yield and power consumption.
Keyword (in Japanese) (See Japanese page) 
(in English) manufacturing variability / self-compensation / post-silicon tuning / yield / power consumption / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 451, VLD2012-138, pp. 13-17, March 2013.
Paper # VLD2012-138 
Date of Issue 2013-02-25 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2012-138

Conference Information
Committee VLD  
Conference Date 2013-03-04 - 2013-03-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2013-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Self-Compensation of Manufacturing Variability using On-Chip Sensors 
Sub Title (in English)  
Keyword(1) manufacturing variability  
Keyword(2) self-compensation  
Keyword(3) post-silicon tuning  
Keyword(4) yield  
Keyword(5) power consumption  
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1st Author's Name Yuma Higuchi  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Masanori Hashimoto  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Takao Onoye  
3rd Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2013-03-04 14:40:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2012-138 
Volume (vol) vol.112 
Number (no) no.451 
Page pp.13-17 
#Pages 5 
Date of Issue 2013-02-25 (VLD) 

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