Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-04-11 11:40
[Invited Talk] Filament Scaling Forming Technique and Level-Verify-Write Scheme with Endurance Over 10 million Cycles in ReRAM
Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Shunsaku Muraoka, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Kunitoshi Aono (Panasonic) ICD2013-4
Abstract (in Japanese) (See Japanese page) 
(in English) Endurance characteristics over 10 million cycles almost 10 times higher as existing, and the small filament for leading edge process, are realized in 1T1R ReRAM array. A 2-step forming circuit with self-consistent and current-limiting schemes, and a level-verify circuit with verify algorithm for transient state recovery and adaptive write pulse generation, are developed in a 110nm 256Kb test chip.
Keyword (in Japanese) (See Japanese page) 
(in English) ReRAM / 1T1R / Filament / 2-step forming / Level-verify / Endurance / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 1, ICD2013-4, pp. 15-20, April 2013.
Paper # ICD2013-4 
Date of Issue 2013-04-04 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2013-4

Conference Information
Committee ICD  
Conference Date 2013-04-11 - 2013-04-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Advanced Industrial Science and Technology (AIST) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Memory Device Technologies 
Paper Information
Registration To ICD 
Conference Code 2013-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Filament Scaling Forming Technique and Level-Verify-Write Scheme with Endurance Over 10 million Cycles in ReRAM 
Sub Title (in English)  
Keyword(1) ReRAM  
Keyword(2) 1T1R  
Keyword(3) Filament  
Keyword(4) 2-step forming  
Keyword(5) Level-verify  
Keyword(6) Endurance  
Keyword(7)  
Keyword(8)  
1st Author's Name Akifumi Kawahara  
1st Author's Affiliation Panasonic Corporation (Panasonic)
2nd Author's Name Ken Kawai  
2nd Author's Affiliation Panasonic Corporation (Panasonic)
3rd Author's Name Yuuichirou Ikeda  
3rd Author's Affiliation Panasonic Corporation (Panasonic)
4th Author's Name Yoshikazu Katoh  
4th Author's Affiliation Panasonic Corporation (Panasonic)
5th Author's Name Ryotaro Azuma  
5th Author's Affiliation Panasonic Corporation (Panasonic)
6th Author's Name Yuhei Yoshimoto  
6th Author's Affiliation Panasonic Corporation (Panasonic)
7th Author's Name Kouhei Tanabe  
7th Author's Affiliation Panasonic Corporation (Panasonic)
8th Author's Name Zhiqiang Wei  
8th Author's Affiliation Panasonic Corporation (Panasonic)
9th Author's Name Takeki Ninomiya  
9th Author's Affiliation Panasonic Corporation (Panasonic)
10th Author's Name Koji Katayama  
10th Author's Affiliation Panasonic Corporation (Panasonic)
11th Author's Name Shunsaku Muraoka  
11th Author's Affiliation Panasonic Corporation (Panasonic)
12th Author's Name Atsushi Himeno  
12th Author's Affiliation Panasonic Corporation (Panasonic)
13th Author's Name Kazuhiko Shimakawa  
13th Author's Affiliation Panasonic Corporation (Panasonic)
14th Author's Name Takeshi Takagi  
14th Author's Affiliation Panasonic Corporation (Panasonic)
15th Author's Name Kunitoshi Aono  
15th Author's Affiliation Panasonic Corporation (Panasonic)
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2013-04-11 11:40:00 
Presentation Time 50 minutes 
Registration for ICD 
Paper # ICD2013-4 
Volume (vol) vol.113 
Number (no) no.1 
Page pp.15-20 
#Pages 6 
Date of Issue 2013-04-04 (ICD) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan