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Paper Abstract and Keywords
Presentation 2013-04-12 09:20
[Invited Talk] High Performance and High Reliability 40nm Embedded SG-MONOS Flash Macros for Automotive -- 160MHz Random Access for Code and Endurance Over 10M Cycles for Data --
Tomoya Ogawa, Takashi Kono, Takashi Ito, Tamaki Tsuruda, Takayuki Nishiyama, Tsutomu Nagasawa, Yoshiyuki Kawashima, Hideto Hidaka, Tadaaki Yamauchi (Renesas Electronics) ICD2013-13
Abstract (in Japanese) (See Japanese page) 
(in English) The markets of Flash MCUs, microcontrollers with embedded flash memory (eFlash), have been steadily growing since the middle of 1990s. Especially, in automotive, Flash MCUs have become essential to realize higher fuel-efficiency, higher safety, and more convenient operativity by the complicated real-time controls. For this reason, high density and high speed random read access are strongly required for eFlash. In addition, what characterizes the requirements for eFlash in automotive are secured operations and data reliability with the excellent program/erase (P/E) cycling under high temperature. We investigate 40nm Embedded SG-MONOS Flash Macros for Automotive.
Keyword (in Japanese) (See Japanese page) 
(in English) for Automotive / 160MHz Random Access / SG-MONOS / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 1, ICD2013-13, pp. 61-66, April 2013.
Paper # ICD2013-13 
Date of Issue 2013-04-04 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2013-13

Conference Information
Committee ICD  
Conference Date 2013-04-11 - 2013-04-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Advanced Industrial Science and Technology (AIST) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Memory Device Technologies 
Paper Information
Registration To ICD 
Conference Code 2013-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High Performance and High Reliability 40nm Embedded SG-MONOS Flash Macros for Automotive 
Sub Title (in English) 160MHz Random Access for Code and Endurance Over 10M Cycles for Data 
Keyword(1) for Automotive  
Keyword(2) 160MHz Random Access  
Keyword(3) SG-MONOS  
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1st Author's Name Tomoya Ogawa  
1st Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
2nd Author's Name Takashi Kono  
2nd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
3rd Author's Name Takashi Ito  
3rd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
4th Author's Name Tamaki Tsuruda  
4th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
5th Author's Name Takayuki Nishiyama  
5th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
6th Author's Name Tsutomu Nagasawa  
6th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
7th Author's Name Yoshiyuki Kawashima  
7th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
8th Author's Name Hideto Hidaka  
8th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
9th Author's Name Tadaaki Yamauchi  
9th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
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Speaker Author-1 
Date Time 2013-04-12 09:20:00 
Presentation Time 50 minutes 
Registration for ICD 
Paper # ICD2013-13 
Volume (vol) vol.113 
Number (no) no.1 
Page pp.61-66 
#Pages 6 
Date of Issue 2013-04-04 (ICD) 

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