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Paper Abstract and Keywords
Presentation 2013-04-12 15:25
Fundamental Study on Visualization of Intentional Electromagnetic Interference Fault Injection on Cryptographic Device
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2013-8
Abstract (in Japanese) (See Japanese page) 
(in English) An IEMI-based fault injection is drawing much attention in the field of physical attacks on cryptographic devices due to its non-contact and non-invasive properties. This paper explores the relations between injection intensity and fault occurrence during IEMI-based fault injection. The basic idea is to generate a map of the effect of such fault injection for different frequencies. Through the map generated on an evaluation board, we demonstrate how an injected EM wave is propagated to the board depending on the intensity and frequency. We also demonstrate a detailed propagation of induced EM waves inside a target module (i.e., a cryptographic LSI chip) and other modules. Using the experimental map generation, we examine the condition that a transient fault available for attacks is generated in the cryptographic module. In addition, we discuss a possible countermeasure against IEMI-based fault injection.
Keyword (in Japanese) (See Japanese page) 
(in English) Electromagnetic Interference / Electromagnetic Information Leakage / Fault Injection Analysis / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 2, EMCJ2013-8, pp. 43-47, April 2013.
Paper # EMCJ2013-8 
Date of Issue 2013-04-05 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2013-04-12 - 2013-04-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Okayama Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) PCM,Information Security,EMC 
Paper Information
Registration To EMCJ 
Conference Code 2013-04-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Study on Visualization of Intentional Electromagnetic Interference Fault Injection on Cryptographic Device 
Sub Title (in English)  
Keyword(1) Electromagnetic Interference  
Keyword(2) Electromagnetic Information Leakage  
Keyword(3) Fault Injection Analysis  
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1st Author's Name Yu-ichi Hayashi  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Naofumi Homma  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Takaaki Mizuki  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Takafumi Aoki  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Hideaki Sone  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2013-04-12 15:25:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2013-8 
Volume (vol) vol.113 
Number (no) no.2 
Page pp.43-47 
#Pages 5 
Date of Issue 2013-04-05 (EMCJ) 

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