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Paper Abstract and Keywords
Presentation 2013-04-12 10:20
[Invited Talk] Unified Solid-State-Storage Architecture with NAND Flash Memory and ReRAM that Tolerates 32× Higher BER for Big-Data Applications
Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo), Masafumi Doi, Ken Takeuchi (Chuo Univ.) ICD2013-14
Abstract (in Japanese) (See Japanese page) 
(in English) Unified solid-state storage (USSS) with hybrid NAND flash memory / ReRAM provides high system-level data protection. Four highly reliable techniques, reverse-mirroring (RM), error-reduction synthesis (ERS), page-RAID, and error-masking (EM) are proposed in the unified storage controller. RM and EM are the mirroring techniques. These technologies utilize NAND error patterns asymmetries. Moreover fast, page-rewritable, and high endurance ReRAM is effectively used for temporary storage. As a result, the acceptable raw BER of NAND increases by 32-times, or endurance or data retention time of NAND is increased by 4.2 or 34-times, respectively, by applying all of the proposed techniques.
Keyword (in Japanese) (See Japanese page) 
(in English) Storage / Big-data / Reliability / ReRAM / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 1, ICD2013-14, pp. 67-72, April 2013.
Paper # ICD2013-14 
Date of Issue 2013-04-04 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ICD  
Conference Date 2013-04-11 - 2013-04-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Advanced Industrial Science and Technology (AIST) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Memory Device Technologies 
Paper Information
Registration To ICD 
Conference Code 2013-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Unified Solid-State-Storage Architecture with NAND Flash Memory and ReRAM that Tolerates 32× Higher BER for Big-Data Applications 
Sub Title (in English)  
Keyword(1) Storage  
Keyword(2) Big-data  
Keyword(3) Reliability  
Keyword(4) ReRAM  
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1st Author's Name Shuhei Tanakamaru  
1st Author's Affiliation Chuo University/University of Tokyo (Chuo Univ./Univ. of Tokyo)
2nd Author's Name Masafumi Doi  
2nd Author's Affiliation Chuo University (Chuo Univ.)
3rd Author's Name Ken Takeuchi  
3rd Author's Affiliation Chuo University (Chuo Univ.)
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Speaker Author-1 
Date Time 2013-04-12 10:20:00 
Presentation Time 50 minutes 
Registration for ICD 
Paper # ICD2013-14 
Volume (vol) vol.113 
Number (no) no.1 
Page pp.67-72 
#Pages 6 
Date of Issue 2013-04-04 (ICD) 

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