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Paper Abstract and Keywords
Presentation 2013-08-29 09:50
Optical Distance Measurement Using Frequency Noises of a Semiconductor Laser
Naoya Shimizu, Shinya Maehara (Niigata Univ.), Kohei Doi (Touhoku Gakuin Univ.), Hideaki Arai, Takashi Sato, Masashi Ohkawa, Yasuo Ohdaira, Shuichi Sakamoto (Niigata Univ.) R2013-30 EMD2013-36 CPM2013-55 OPE2013-59 LQE2013-29
Abstract (in Japanese) (See Japanese page) 
(in English) A semiconductor laser’s frequency fluctuates owing to the refractive index fluctuations caused by the spontaneous emission in a laser cavity. In this study, a new application of semiconductor laser’s frequency noise characteristics is discussed. We propose a new laser rangefinder using the semiconductor laser’s frequency noise. This method calculates the correlation between the divided laser beams and determines the optical distance without any modulation, and its accuracy are expected unchanged even in a long distance measurement. We measured the distance from 0 to 35m using the proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) Semiconductor laser / Frequency noise / Laser rangefinder / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 190, LQE2013-29, pp. 11-14, Aug. 2013.
Paper # LQE2013-29 
Date of Issue 2013-08-22 (R, EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2013-30 EMD2013-36 CPM2013-55 OPE2013-59 LQE2013-29

Conference Information
Committee OPE LQE CPM EMD R  
Conference Date 2013-08-29 - 2013-08-30 
Place (in Japanese) (See Japanese page) 
Place (in English) sun-refre Hakodate 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To LQE 
Conference Code 2013-08-OPE-LQE-CPM-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optical Distance Measurement Using Frequency Noises of a Semiconductor Laser 
Sub Title (in English)  
Keyword(1) Semiconductor laser  
Keyword(2) Frequency noise  
Keyword(3) Laser rangefinder  
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1st Author's Name Naoya Shimizu  
1st Author's Affiliation Niigata Uniiversity (Niigata Univ.)
2nd Author's Name Shinya Maehara  
2nd Author's Affiliation Niigata Uniiversity (Niigata Univ.)
3rd Author's Name Kohei Doi  
3rd Author's Affiliation Touhoku Gakuin University (Touhoku Gakuin Univ.)
4th Author's Name Hideaki Arai  
4th Author's Affiliation Niigata Uniiversity (Niigata Univ.)
5th Author's Name Takashi Sato  
5th Author's Affiliation Niigata Uniiversity (Niigata Univ.)
6th Author's Name Masashi Ohkawa  
6th Author's Affiliation Niigata Uniiversity (Niigata Univ.)
7th Author's Name Yasuo Ohdaira  
7th Author's Affiliation Niigata Uniiversity (Niigata Univ.)
8th Author's Name Shuichi Sakamoto  
8th Author's Affiliation Niigata Uniiversity (Niigata Univ.)
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Speaker Author-1 
Date Time 2013-08-29 09:50:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # R2013-30, EMD2013-36, CPM2013-55, OPE2013-59, LQE2013-29 
Volume (vol) vol.113 
Number (no) no.186(R), no.187(EMD), no.188(CPM), no.189(OPE), no.190(LQE) 
Page pp.11-14 
#Pages 4 
Date of Issue 2013-08-22 (R, EMD, CPM, OPE, LQE) 

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