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Paper Abstract and Keywords
Presentation 2013-09-03 14:05
Hardness of Classically Simulating Quantum Circuits with Unbounded Toffoli and Fan-Out Gates
Yasuhiro Takahashi (NTT), Takeshi Yamazaki, Kazuyuki Tanaka (Tohoku Univ.) COMP2013-29
Abstract (in Japanese) (See Japanese page) 
(in English) We study the classical simulatability of constant-depth polynomial-size quantum circuits followed by only one single-qubit measurement, where the circuits consist of universal gates on at most two qubits and additional gates on an unbounded number of qubits. First, we consider unbounded Toffoli gates as additional gates and deal with the weak simulation, i.e., sampling the output probability distribution. We show that there exists a constant-depth quantum circuit with only one unbounded Toffoli gate that is not weakly simulatable, unless BQP $subseteq$ PostBPP $cap$ AM. Then, we consider unbounded fan-out gates as additional gates and deal with the strong simulation, i.e., computing the output probability. We show that there exists a constant-depth quantum circuit with only two unbounded fan-out gates that is not strongly simulatable, unless P = PP. These results are in contrast to the fact that any constant-depth quantum circuit without additional gates on an unbounded number of qubits is strongly and weakly simulatable.
Keyword (in Japanese) (See Japanese page) 
(in English) constant-depth quantum circuit / classical simulation / unbounded Toffoli gate / unbounded fan-out gate / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 198, COMP2013-29, pp. 27-34, Sept. 2013.
Paper # COMP2013-29 
Date of Issue 2013-08-27 (COMP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee COMP  
Conference Date 2013-09-03 - 2013-09-03 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To COMP 
Conference Code 2013-09-COMP 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Hardness of Classically Simulating Quantum Circuits with Unbounded Toffoli and Fan-Out Gates 
Sub Title (in English)  
Keyword(1) constant-depth quantum circuit  
Keyword(2) classical simulation  
Keyword(3) unbounded Toffoli gate  
Keyword(4) unbounded fan-out gate  
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1st Author's Name Yasuhiro Takahashi  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Takeshi Yamazaki  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Kazuyuki Tanaka  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2013-09-03 14:05:00 
Presentation Time 35 minutes 
Registration for COMP 
Paper # COMP2013-29 
Volume (vol) vol.113 
Number (no) no.198 
Page pp.27-34 
#Pages 8 
Date of Issue 2013-08-27 (COMP) 

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