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Paper Abstract and Keywords
Presentation 2013-11-29 15:25
Current Wave Pattern Analysis for Anomaly Detection of Electrical Devices
Yuto Tamura, Takeshi Takai, Takekazu Kato, Takashi Matsuyama (Kyoto Univ.) ASN2013-115
Abstract (in Japanese) (See Japanese page) 
(in English) This paper proposes a novel method to detect and evaluate anomaly of an electric appliance from variations of current waveform patterns that are measured under ordinary usage. Since the electrical appliance is regarded as a large electrical circuit, a specific pattern of the current waveform can be observed from one appliance and another. This indicates that anomaly or degradation can be detected by observing a variation of the current waveform patterns from those of the normal condition. The appliance, however, autonomously controls itself depending on its internal states and an external environment, and then the waveform changes its pattern every moment. Thus, variations caused by those controls or anomaly should be distinguished from each other. In this paper, we propose a method to detect anomaly or degradation by analyzing variations of the current waveform obtained from each control state, which is identified from power consumption patterns of the appliance. The experimental results using a fan and a refrigerator show that we can detect variations of the current waveform patterns caused by anomaly or degradation and evaluate them both qualitatively and quantitatively.
Keyword (in Japanese) (See Japanese page) 
(in English) Anomaly detection / Degration detection / Current waveform pattern analysis / Power data segmentation / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 328, ASN2013-115, pp. 135-140, Nov. 2013.
Paper # ASN2013-115 
Date of Issue 2013-11-21 (ASN) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ASN2013-115

Conference Information
Committee ASN  
Conference Date 2013-11-28 - 2013-11-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Ambient Intelligence, Sensor Networks, Smart Structure, Smart City, Structural Health Monitoring, ZEB, etc. 
Paper Information
Registration To ASN 
Conference Code 2013-11-ASN 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Current Wave Pattern Analysis for Anomaly Detection of Electrical Devices 
Sub Title (in English)  
Keyword(1) Anomaly detection  
Keyword(2) Degration detection  
Keyword(3) Current waveform pattern analysis  
Keyword(4) Power data segmentation  
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1st Author's Name Yuto Tamura  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Takeshi Takai  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Takekazu Kato  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Takashi Matsuyama  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2013-11-29 15:25:00 
Presentation Time 25 minutes 
Registration for ASN 
Paper # ASN2013-115 
Volume (vol) vol.113 
Number (no) no.328 
Page pp.135-140 
#Pages 6 
Date of Issue 2013-11-21 (ASN) 

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