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Paper Abstract and Keywords
Presentation 2014-01-28 15:00
[Poster Presentation] Analyzing Data-Retention Characteristics of ReRAM
Hiroki Yamazawa (Chuo Univ.), Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2013-114
Abstract (in Japanese) (See Japanese page) 
(in English) Resistive RAM (ReRAM) is one of the most promising candidates for next generation nonvolatile memories due to its potential to provide fast write and read, high endurance and low power operation. A conductive filament is generated by a voltage pulse called Forming. ReRAM becomes high/low resistance state when a conductive filament is destroyed/regrown by voltage pulse of reverse/same direction to/as Forming, respectively. High or low resistance is assigned to “1” or “0”. This paper reports data-retention reliability evaluation of ReRAM.
Keyword (in Japanese) (See Japanese page) 
(in English) ReRAM / reliability / data-retention / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 419, ICD2013-114, pp. 37-37, Jan. 2014.
Paper # ICD2013-114 
Date of Issue 2014-01-21 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2013-114

Conference Information
Committee ICD  
Conference Date 2014-01-28 - 2014-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Univ. Tokeidai Kinenkan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2014-01-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analyzing Data-Retention Characteristics of ReRAM 
Sub Title (in English)  
Keyword(1) ReRAM  
Keyword(2) reliability  
Keyword(3) data-retention  
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1st Author's Name Hiroki Yamazawa  
1st Author's Affiliation Chuo University (Chuo Univ.)
2nd Author's Name Shuhei Tanakamaru  
2nd Author's Affiliation Chuo University/University of Tokyo (Chuo Univ./Univ. of Tokyo)
3rd Author's Name Ken Takeuchi  
3rd Author's Affiliation Chuo University (Chuo Univ.)
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Speaker Author-1 
Date Time 2014-01-28 15:00:00 
Presentation Time 120 minutes 
Registration for ICD 
Paper # ICD2013-114 
Volume (vol) vol.113 
Number (no) no.419 
Page p.37 
#Pages 1 
Date of Issue 2014-01-21 (ICD) 

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