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Paper Abstract and Keywords
Presentation 2014-01-28 15:00
[Poster Presentation] Diode Modeling with Lossy Nonlinear Capacitance Model
Ryo Nahara, Kosuke Katayama, Kyoya Takano, Mizuki Motoyoshi, Shuhei Amakawa, Takeshi Yoshida, Minoru Fujishima (Hiroshima Univ.) ICD2013-127 Link to ES Tech. Rep. Archives: ICD2013-127
Abstract (in Japanese) (See Japanese page) 
(in English) For precise estimation of power consumption and circuit characteristics, MOSFET models used in circuit simulation should have predictive power for measured results of DC, small-signal and large-signal characteristics. By using the MOSFET model constructed only from small-signal characteristics, however, measured and simulated results of large-signal characteristics often show considerable discrepancy. In this paper, a nonlinear diode model, as a part of the MOSFET, is obtained from bias-dependent scattering parameters. A pn diode is fabricated with 65nm CMOS process and it is modeled as a lossy nonlinear capacitor using voltage-dependent small-signal characteristics from DC to 60 GHz. The diode model is expected to contribute to a predictive MOSFET model for large-signal characteristics as well as small-signal characteristics.
Keyword (in Japanese) (See Japanese page) 
(in English) diode / MOSFET / modeling / non-linear device / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 419, ICD2013-127, pp. 63-63, Jan. 2014.
Paper # ICD2013-127 
Date of Issue 2014-01-21 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2013-127 Link to ES Tech. Rep. Archives: ICD2013-127

Conference Information
Committee ICD  
Conference Date 2014-01-28 - 2014-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Univ. Tokeidai Kinenkan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2014-01-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Diode Modeling with Lossy Nonlinear Capacitance Model 
Sub Title (in English)  
Keyword(1) diode  
Keyword(2) MOSFET  
Keyword(3) modeling  
Keyword(4) non-linear device  
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1st Author's Name Ryo Nahara  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Kosuke Katayama  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Kyoya Takano  
3rd Author's Affiliation Hiroshima University (Hiroshima Univ.)
4th Author's Name Mizuki Motoyoshi  
4th Author's Affiliation Hiroshima University (Hiroshima Univ.)
5th Author's Name Shuhei Amakawa  
5th Author's Affiliation Hiroshima University (Hiroshima Univ.)
6th Author's Name Takeshi Yoshida  
6th Author's Affiliation Hiroshima University (Hiroshima Univ.)
7th Author's Name Minoru Fujishima  
7th Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Speaker Author-1 
Date Time 2014-01-28 15:00:00 
Presentation Time 120 minutes 
Registration for ICD 
Paper # ICD2013-127 
Volume (vol) vol.113 
Number (no) no.419 
Page p.63 
#Pages
Date of Issue 2014-01-21 (ICD) 


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