Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-01-31 14:50
A Study of Thermal Deformation of box type resin part in Reflow Process
Masayuki Tamura, Toshiyuki Shimoda (JAE) EMD2013-139
Abstract (in Japanese) (See Japanese page) 
(in English) LCP is used many of Insulator(INS) materials. Resins of LCP have the big anisotropy of the coefficient of thermal expansion(CTE),by orientation of molecules and fibers at the time of injection molding. The residual stress in INS is relaxed at the time of the first heating. Since relaxation of residual stress is thermal deformation, it includes in a CTE. The main factors of the thermal deformation of the INS are an orientation difference of the CTE, and a difference before and after the heating.
The purposes of this study are grasping the characteristic of the box type resin part made from LCP thermal deformation, and reproducing the thermal deformation in analysis.
Keyword (in Japanese) (See Japanese page) 
(in English) SMT / Connector / Reflow / Thermal Deformation / Anisotropy / Orientation / Coefficient of Thermal Expansion / Residual Stress  
Reference Info. IEICE Tech. Rep., vol. 113, no. 425, EMD2013-139, pp. 17-22, Jan. 2014.
Paper # EMD2013-139 
Date of Issue 2014-01-24 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2013-139

Conference Information
Committee EMD  
Conference Date 2014-01-31 - 2014-01-31 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2014-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study of Thermal Deformation of box type resin part in Reflow Process 
Sub Title (in English)  
Keyword(1) SMT  
Keyword(2) Connector  
Keyword(3) Reflow  
Keyword(4) Thermal Deformation  
Keyword(5) Anisotropy  
Keyword(6) Orientation  
Keyword(7) Coefficient of Thermal Expansion  
Keyword(8) Residual Stress  
1st Author's Name Masayuki Tamura  
1st Author's Affiliation Japan Aviation Electronics Industry (JAE)
2nd Author's Name Toshiyuki Shimoda  
2nd Author's Affiliation Japan Aviation Electronics Industry (JAE)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2014-01-31 14:50:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2013-139 
Volume (vol) vol.113 
Number (no) no.425 
Page pp.17-22 
#Pages
Date of Issue 2014-01-24 (EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan