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Paper Abstract and Keywords
Presentation 2014-03-03 16:00
Latch-based AES Encryption Circuit Against Fault Analysis
Youhua Shi, Hiroaki Taniguchi, Nozomu Togawa, Masao Yanagisawa (Waseda Univ.) VLD2013-140
Abstract (in Japanese) (See Japanese page) 
(in English) In general, cryptography is considered to be secure because it is based on complicated mathematical theories. In recent year, however, attacks on not crypto algorithms but hardware implementations such as fault analysis methods have posed new security threats. Cryptographic circuits are prone to fault analysis that intend to retrieve secret data by means of malicious fault injection. Clock-adjustment, voltage change, and laser manipulation can be used to inject malicious faults during the execution of a crypto circuit. As countermeasures against fault analysis, area-redundant methods such as triple modular redundant(TMR) and timing-redundant methods have been proposed at the cost of area or throughput. In this paper, we proposed a latch-based AES encryption circuit, with 18.1% area overhead and 5% throughput improvement, which can detect all the possible errors during the fault analysis region of clock glitch based fault analysis. In addition to fault analysis detection, the proposed method can also prevent the transmission and the use of erroneous results, and then can guarantee the correctness of the final encrypted outputs.
Keyword (in Japanese) (See Japanese page) 
(in English) advanced encryption standard / side-channel attacks / fault analysis / time borrowing end{ekeyword} / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 454, VLD2013-140, pp. 37-42, March 2014.
Paper # VLD2013-140 
Date of Issue 2014-02-24 (VLD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee VLD  
Conference Date 2014-03-03 - 2014-03-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2014-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Latch-based AES Encryption Circuit Against Fault Analysis 
Sub Title (in English)  
Keyword(1) advanced encryption standard  
Keyword(2) side-channel attacks  
Keyword(3) fault analysis  
Keyword(4) time borrowing end{ekeyword}  
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1st Author's Name Youhua Shi  
1st Author's Affiliation Waseda University (Waseda Univ.)
2nd Author's Name Hiroaki Taniguchi  
2nd Author's Affiliation Waseda University (Waseda Univ.)
3rd Author's Name Nozomu Togawa  
3rd Author's Affiliation Waseda University (Waseda Univ.)
4th Author's Name Masao Yanagisawa  
4th Author's Affiliation Waseda University (Waseda Univ.)
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Speaker Author-1 
Date Time 2014-03-03 16:00:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2013-140 
Volume (vol) vol.113 
Number (no) no.454 
Page pp.37-42 
#Pages
Date of Issue 2014-02-24 (VLD) 


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