Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-06-20 16:25
An evaluation for Testability of Functional k-Time Expansion Models
Tetsuya Masuda, Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-17
Abstract (in Japanese) (See Japanese page) 
(in English) A test generation method using functional k-time expansion models for data paths was proposed. In the test generation
method using functional k-time expansion models, some functional k-time expansion models are generated and test sequences are generated
for the models. A controller is augmented to enable the behaviors of the functional k-time expansion models to be executed. The number of
generated functional k-time expansion models is given as a constraint to suppress hardware overhead by the controller augmentation. It is
important to generate functional k-time expansion models with high testability to achieve high fault coverage. In the previous work, only the
number of time expansion was used as a measure of testability for functional k-time expansion models. However, other elements which
affect the testability are considered. In this paper, the testability of functional k-time expansion models is evaluated to clarify elements which
affect to the testability. In the experiments, some functional k-time expansion models for an example circuit are generated, and the number of
detected faults and the test generation time for each model are evaluated.
Keyword (in Japanese) (See Japanese page) 
(in English) non-scan testing / fuctional k-time expansion models / controller augmentation / sequential test generation / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 99, DC2014-17, pp. 45-50, June 2014.
Paper # DC2014-17 
Date of Issue 2014-06-13 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2014-17

Conference Information
Committee DC  
Conference Date 2014-06-20 - 2014-06-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design/Test/Verification 
Paper Information
Registration To DC 
Conference Code 2014-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An evaluation for Testability of Functional k-Time Expansion Models 
Sub Title (in English)  
Keyword(1) non-scan testing  
Keyword(2) fuctional k-time expansion models  
Keyword(3) controller augmentation  
Keyword(4) sequential test generation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tetsuya Masuda  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Jun Nishimaki  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Toshinori Hosokawa  
3rd Author's Affiliation Nihon University (Nihon Univ.)
4th Author's Name Hideo Fujiwara  
4th Author's Affiliation Osaka Gakuin University (Osaka Gakuin Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2014-06-20 16:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2014-17 
Volume (vol) vol.114 
Number (no) no.99 
Page pp.45-50 
#Pages 6 
Date of Issue 2014-06-13 (DC) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan