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Paper Abstract and Keywords
Presentation 2014-07-31 10:45
A study on measurement of laser spectrum purities -- relations between linewidth measurement and optical frequency noise spectrum --
Makoto Shikata, Tsuneo Mori, Kazuhiro Fukao, Makoto Inagaki (SYCATUS) OCS2014-28
Abstract (in Japanese) (See Japanese page) 
(in English) Optical spectrum linewidth is a basic parameter to evaluate spectrum purities of lasers for optical communications, however, conventional optical linewidth measurement method is insufficient to obtain enough characterization for advanced optical communication methods. Optical frequency noise spectrum is a promising parameter for the precise analysis of laser spectrum purities. This study reports the usefulness of the analysis by optical frequency noise spectrum through the experimental verifications of the relation between the optical spectrum linewidth and the optical frequency noise spectrum.
Keyword (in Japanese) (See Japanese page) 
(in English) Optical Frequency Noise / Linewidth / Semiconductor Laser / Digital Coherent / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 167, OCS2014-28, pp. 15-20, July 2014.
Paper # OCS2014-28 
Date of Issue 2014-07-24 (OCS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OCS2014-28

Conference Information
Committee OCS  
Conference Date 2014-07-31 - 2014-07-31 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To OCS 
Conference Code 2014-07-OCS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study on measurement of laser spectrum purities 
Sub Title (in English) relations between linewidth measurement and optical frequency noise spectrum 
Keyword(1) Optical Frequency Noise  
Keyword(2) Linewidth  
Keyword(3) Semiconductor Laser  
Keyword(4) Digital Coherent  
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1st Author's Name Makoto Shikata  
1st Author's Affiliation SYCATUS Corporation (SYCATUS)
2nd Author's Name Tsuneo Mori  
2nd Author's Affiliation SYCATUS Corporation (SYCATUS)
3rd Author's Name Kazuhiro Fukao  
3rd Author's Affiliation SYCATUS Corporation (SYCATUS)
4th Author's Name Makoto Inagaki  
4th Author's Affiliation SYCATUS Corporation (SYCATUS)
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Speaker Author-1 
Date Time 2014-07-31 10:45:00 
Presentation Time 25 minutes 
Registration for OCS 
Paper # OCS2014-28 
Volume (vol) vol.114 
Number (no) no.167 
Page pp.15-20 
#Pages 6 
Date of Issue 2014-07-24 (OCS) 

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