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Paper Abstract and Keywords
Presentation 2014-10-17 16:20
Optimum Lifetime Prediction Testing under the Arrhenius Law
Naoki Tabuchi, Hideo Hirose (Kyutech) R2014-60
Abstract (in Japanese) (See Japanese page) 
(in English) In observing the actual lifetime of electric products, accelerated life tests are often used to save testing time and cost.
In this paper,
we search for the optimum life test plans of electrical
insulation for thermal stress via the simulation study assuming that the Arrhenius
law holds between the thermal stress and the lifetime and that the lifetime probability distribution follows a normal, a generalized logistic, and generalized Pareto distributions.
In considering the weakest link situation consisting of many elements, we deal with the Weibull probability distribution.
The variance of the estimate for the lifetime at the temperature of use depends on the underlying probability distribution.
Keyword (in Japanese) (See Japanese page) 
(in English) accelerated lifetime test / thermal deterioration / Arrhenius law / generalized Pareto distribution / generalized logistic distribution / normal distribution / maximum likelihood estimation method / extreme-value distribution  
Reference Info. IEICE Tech. Rep., vol. 114, no. 256, R2014-60, pp. 31-36, Oct. 2014.
Paper # R2014-60 
Date of Issue 2014-10-10 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2014-60

Conference Information
Committee R  
Conference Date 2014-10-17 - 2014-10-17 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2014-10-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optimum Lifetime Prediction Testing under the Arrhenius Law 
Sub Title (in English)  
Keyword(1) accelerated lifetime test  
Keyword(2) thermal deterioration  
Keyword(3) Arrhenius law  
Keyword(4) generalized Pareto distribution  
Keyword(5) generalized logistic distribution  
Keyword(6) normal distribution  
Keyword(7) maximum likelihood estimation method  
Keyword(8) extreme-value distribution  
1st Author's Name Naoki Tabuchi  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Hideo Hirose  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
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Speaker Author-1 
Date Time 2014-10-17 16:20:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2014-60 
Volume (vol) vol.114 
Number (no) no.256 
Page pp.31-36 
#Pages 6 
Date of Issue 2014-10-10 (R) 

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