Paper Abstract and Keywords |
Presentation |
2014-10-24 17:20
Imaging method of temperatur distribution in Bi-2212 intrinsic Josephson junction stacks by double-sided fabrication Tsubasa Nishikata, Yukio Kotaki, Takahiro Kato, Takayuki Ishibashi, Kanji Yasui (Nagaoka Univ. of Tech.) CPM2014-112 Link to ES Tech. Rep. Archives: CPM2014-112 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Bi2Sr2CaCu2Ox (Bi-2212) crystal behaves as a stack of intrinsic Josephson junctions (IJJs). Recently many researchers have reported THz electromagnetic radiation from large mesa structures patterned on Bi-2212 crystal. In this study, we fabricated a Bi-2212 stack with seize of 183×38×1.15 μm^3 by double-sided patterning (DSP) process. To confirm the THz emission, current voltage characteristics was investigated and detection experiment of electromagnetic radiation by a Si bolometer was done. We detected the emission signal at 30, 40 and 50 K. Voltage appeared in a response of the bolometer was 513 mV at 30 K. Also the voltage decreased with increasing temperature from 513 mV at 30 K to 208 ~ 286 mV at 50 K. We found that the result arise from a strong self heating effect in Bi-2212 stack.
In this paper we will report the next step to estimate the temperature distribution in Bi-2212 intrinsic Josephson junction stacks by DSP process. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Terahertz / Josephson junction / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 114, no. 276, CPM2014-112, pp. 39-43, Oct. 2014. |
Paper # |
CPM2014-112 |
Date of Issue |
2014-10-17 (CPM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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CPM2014-112 Link to ES Tech. Rep. Archives: CPM2014-112 |
Conference Information |
Committee |
CPM |
Conference Date |
2014-10-24 - 2014-10-25 |
Place (in Japanese) |
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Paper Information |
Registration To |
CPM |
Conference Code |
2014-10-CPM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Imaging method of temperatur distribution in Bi-2212 intrinsic Josephson junction stacks by double-sided fabrication |
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Terahertz |
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Josephson junction |
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1st Author's Name |
Tsubasa Nishikata |
1st Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
2nd Author's Name |
Yukio Kotaki |
2nd Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
3rd Author's Name |
Takahiro Kato |
3rd Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
4th Author's Name |
Takayuki Ishibashi |
4th Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
5th Author's Name |
Kanji Yasui |
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Nagaoka University of Technology (Nagaoka Univ. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2014-10-24 17:20:00 |
Presentation Time |
20 minutes |
Registration for |
CPM |
Paper # |
CPM2014-112 |
Volume (vol) |
vol.114 |
Number (no) |
no.276 |
Page |
pp.39-43 |
#Pages |
5 |
Date of Issue |
2014-10-17 (CPM) |