Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-11-14 15:15
A Study of Electrostatic Discharge Immunity Testing for Wearable Equipment
Takeshi Ishida (Noiseken/UEC), Fengchao Xiao, Yoshio Kami, Osamu Fujiwara, Shuichi Nitta (UEC) EMCJ2014-72
Abstract (in Japanese) (See Japanese page) 
(in English) The electrostatic discharge (ESD) immunity test for electronic equipment is specified in the international standard IEC 61000-4-2 in which the specifications of test equipment and test methods are described. This test is assumed to simulate the ESD event that occurs when a charged human body touches electronic equipment. Wearable electronic equipment, which is spread rapidly in recent years, is used on attachment to a human. Accordingly, the electric potential of the wearable equipment rapidly changes every time the human is electrically charged or discharged, which results in that the equipment is exposed to the transient electromagnetic fields. ESD immunity testing assumed for this situation is not yet developed. In this study, under the assumption that the worst case is an ESD event occurring when the body mounted wearable equipment approaches a metal object, we measured discharge currents due to air discharges from a hand-held metal bar and hemi-sphere metal object attached to the head, arm and waist. As a result, we found that at a human charge voltage of 1 kV, the peak current from the hemi-sphere metal is large in order of the attachment of the waist (15.4 A), arm (12.8 A) and head (12.2 A), whereas the peak current (10.0 A) from the hand-held metal bar is the smallest. It was also found that the discharge currents from the hemi-sphere metal decrease at around 50 ns regardless of the attachment regions, however, the current from the metal bar continues to flow at over 90 ns. This suggests that ESD immunity testing for wearable equipment needs to investigate different specifications of the test equipment and test method from the conventional testing.
Keyword (in Japanese) (See Japanese page) 
(in English) Wearable equipment / human attachment / ESD immunity testing / air discharge / discharge current / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 304, EMCJ2014-72, pp. 31-35, Nov. 2014.
Paper # EMCJ2014-72 
Date of Issue 2014-11-07 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2014-72

Conference Information
Committee EMCJ PEM  
Conference Date 2014-11-14 - 2014-11-14 
Place (in Japanese) (See Japanese page) 
Place (in English) AIST Tokyo Waterfront 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Photonics-applied Electromagnetic Measurement, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2014-11-EMCJ-PEM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study of Electrostatic Discharge Immunity Testing for Wearable Equipment 
Sub Title (in English)  
Keyword(1) Wearable equipment  
Keyword(2) human attachment  
Keyword(3) ESD immunity testing  
Keyword(4) air discharge  
Keyword(5) discharge current  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takeshi Ishida  
1st Author's Affiliation Noise Laboratory Co.,LTD/University of Electro-communications (Noiseken/UEC)
2nd Author's Name Fengchao Xiao  
2nd Author's Affiliation University of Electro-communications (UEC)
3rd Author's Name Yoshio Kami  
3rd Author's Affiliation University of Electro-communications (UEC)
4th Author's Name Osamu Fujiwara  
4th Author's Affiliation University of Electro-communications (UEC)
5th Author's Name Shuichi Nitta  
5th Author's Affiliation University of Electro-communications (UEC)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2014-11-14 15:15:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2014-72 
Volume (vol) vol.114 
Number (no) no.304 
Page pp.31-35 
#Pages 5 
Date of Issue 2014-11-07 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan