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Paper Abstract and Keywords
Presentation 2014-12-02 15:40
Uniqueness Evaluation of a Current Mismatch type ID Generation Circuit
Kenichi Matsunaga, Shoichi Oshima (NTT), Tadashi Minotani (NTT TELECON), Toshihiko Kondo, Hiroki Morimura (NTT) ICD2014-108 CPSY2014-120
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a low-power and uniquely-distributed ID-generation circuit using process variation. Developed circuit utilizes current mismatch in NMOS pair for unique ID output. In order to evaluate the output 1/0 probability-uniformity and process dependence, the prototype was fabricated in two different 0.18-$mu$m standard CMOS technology. 382 chips were tested and the hamming distances between each chip were calculated. The result shows the circuit architecture generates unique and process-independent ID. Furthermore, the bit-generation efficiency was found to be 0.96 pJ/bit.
Keyword (in Japanese) (See Japanese page) 
(in English) ID generation / Mismatch / Hamming distance / Uniqueness / Binominal distribution / PUF / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 345, ICD2014-108, pp. 135-139, Dec. 2014.
Paper # ICD2014-108 
Date of Issue 2014-11-24 (ICD, CPSY) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2014-108 CPSY2014-120

Conference Information
Committee ICD CPSY  
Conference Date 2014-12-01 - 2014-12-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2014-12-ICD-CPSY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Uniqueness Evaluation of a Current Mismatch type ID Generation Circuit 
Sub Title (in English)  
Keyword(1) ID generation  
Keyword(2) Mismatch  
Keyword(3) Hamming distance  
Keyword(4) Uniqueness  
Keyword(5) Binominal distribution  
Keyword(6) PUF  
Keyword(7)  
Keyword(8)  
1st Author's Name Kenichi Matsunaga  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Shoichi Oshima  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Tadashi Minotani  
3rd Author's Affiliation NTT TELECON (NTT TELECON)
4th Author's Name Toshihiko Kondo  
4th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
5th Author's Name Hiroki Morimura  
5th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
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Speaker Author-1 
Date Time 2014-12-02 15:40:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2014-108, CPSY2014-120 
Volume (vol) vol.114 
Number (no) no.345(ICD), no.346(CPSY) 
Page pp.135-139 
#Pages 5 
Date of Issue 2014-11-24 (ICD, CPSY) 

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