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Paper Abstract and Keywords
Presentation 2015-03-09 15:15
NP-hardness of Finding Minimum Test Set for Detecting Stuck-at and/or Bridging Faults in a Reversible Circuit
Hibiki Takakura, Toshinori Yamada (Saitama Univ.) COMP2014-49
Abstract (in Japanese) (See Japanese page) 
(in English) Reversible circuits are quite attractive because of the possibility of nearly energy-free computation and application to various fields. During designing and constructing a reversible circuit, it is important to test the circuit and detect faults in the circuit. However, as far as the authors know, very few researches on NP-hardness of finding minimum test set for detecting stuck-at and/or bridging faults in a reversible circuit are known. This paper proves that it is NP-hard to find a minimum test set for detecting stuck-at and/or bridging faults in a reversible circuit.
Keyword (in Japanese) (See Japanese page) 
(in English) Reversible Circuits / Stuck-at Faults / Bridging Faults / Complete Test Sets / NP-completeness / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 509, COMP2014-49, pp. 47-51, March 2015.
Paper # COMP2014-49 
Date of Issue 2015-03-02 (COMP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF COMP2014-49

Conference Information
Committee COMP  
Conference Date 2015-03-09 - 2015-03-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Ritsumeikan University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To COMP 
Conference Code 2015-03-COMP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) NP-hardness of Finding Minimum Test Set for Detecting Stuck-at and/or Bridging Faults in a Reversible Circuit 
Sub Title (in English)  
Keyword(1) Reversible Circuits  
Keyword(2) Stuck-at Faults  
Keyword(3) Bridging Faults  
Keyword(4) Complete Test Sets  
Keyword(5) NP-completeness  
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Keyword(7)  
Keyword(8)  
1st Author's Name Hibiki Takakura  
1st Author's Affiliation Saitama University (Saitama Univ.)
2nd Author's Name Toshinori Yamada  
2nd Author's Affiliation Saitama University (Saitama Univ.)
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Speaker Author-1 
Date Time 2015-03-09 15:15:00 
Presentation Time 30 minutes 
Registration for COMP 
Paper # COMP2014-49 
Volume (vol) vol.114 
Number (no) no.509 
Page pp.47-51 
#Pages 5 
Date of Issue 2015-03-02 (COMP) 

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