| Paper Abstract and Keywords |
| Presentation |
2015-05-28 15:40
Growth and preliminary MOSFETs of corundum-structured oxide semiconductors Yoshito Ito, Kentaro Kaneko, Shizuo Fujita (Kyoto Univ.) ED2015-21 CPM2015-6 SDM2015-23 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Growth of corundum-structured oxide semiconductors has been demonstrated using appropriate buffer layers on sapphire by mist CVD. Emphasis was given for $alpha$-In$_2$O$_3$ allowing reasonable crystalline and electrical properties for power device applications with the use of an $alpha$-Ga$_2$O$_3$ buffer layer on sapphire. An $alpha$-In$_2$O$_3$MOSFET showed the clear pinch-off characteristics with the field effect mobility and effective mobility of 60 and 217 cm$^2$/Vs, respectively. together with the on-off ratio of drain current of 10$^6$. The use of mist CVD for the insulator-semiconductor structure was advantageous for low-cost devices. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Gallium Oxide / Indium Oxide / $alpha$-Type Structure / Buffer Layer / Mist CVD / Wide Band Gap Semiconductors / / |
| Reference Info. |
IEICE Tech. Rep., vol. 115, no. 64, CPM2015-6, pp. 27-30, May 2015. |
| Paper # |
CPM2015-6 |
| Date of Issue |
2015-05-21 (ED, CPM, SDM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
ED2015-21 CPM2015-6 SDM2015-23 |
| Conference Information |
| Committee |
ED CPM SDM |
| Conference Date |
2015-05-28 - 2015-05-29 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Venture Business Laboratory, Toyohashi University of Technology |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
crystal growth、devices characterization , etc. |
| Paper Information |
| Registration To |
CPM |
| Conference Code |
2015-05-ED-CPM-SDM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Growth and preliminary MOSFETs of corundum-structured oxide semiconductors |
| Sub Title (in English) |
|
| Keyword(1) |
Gallium Oxide |
| Keyword(2) |
Indium Oxide |
| Keyword(3) |
$alpha$-Type Structure |
| Keyword(4) |
Buffer Layer |
| Keyword(5) |
Mist CVD |
| Keyword(6) |
Wide Band Gap Semiconductors |
| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Yoshito Ito |
| 1st Author's Affiliation |
Kyoto University (Kyoto Univ.) |
| 2nd Author's Name |
Kentaro Kaneko |
| 2nd Author's Affiliation |
Kyoto University (Kyoto Univ.) |
| 3rd Author's Name |
Shizuo Fujita |
| 3rd Author's Affiliation |
Kyoto University (Kyoto Univ.) |
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| Speaker |
Author-3 |
| Date Time |
2015-05-28 15:40:00 |
| Presentation Time |
25 minutes |
| Registration for |
CPM |
| Paper # |
ED2015-21, CPM2015-6, SDM2015-23 |
| Volume (vol) |
vol.115 |
| Number (no) |
no.63(ED), no.64(CPM), no.65(SDM) |
| Page |
pp.27-30 |
| #Pages |
4 |
| Date of Issue |
2015-05-21 (ED, CPM, SDM) |