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Paper Abstract and Keywords
Presentation 2015-06-16 16:25
Using binary decision diagrams for constraint handling in test case generation
Tatsuhiro Tsuchiya (Osaka Univ.) DC2015-21
Abstract (in Japanese) (See Japanese page) 
(in English) This paper discusses constraint handling in test case generation for Combinatorial Interaction Testing (CIT). CIT requires that all interactions involving a few particular features be covered. Constraint handling is an important process in test generation for CIT, where constraints means the condition that any test case must satisfy to be executed. Constraints induce interactions that can never be tested. The constraint handling process needs to ensure that all generated test cases are executable and that all interactions are covered unless they are not testable. This paper proposes constraint handling based on a binary decision diagram. In the proposed approach the given constraints are represented by a single binary decision diagram. Constraint handling can be efficiently performed with this date structure.
Keyword (in Japanese) (See Japanese page) 
(in English) Combinatorial interaction testing / constraint handling / constraints / binary decision diagrams / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 86, DC2015-21, pp. 31-34, June 2015.
Paper # DC2015-21 
Date of Issue 2015-06-09 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2015-21

Conference Information
Committee DC  
Conference Date 2015-06-16 - 2015-06-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliable design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2015-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Using binary decision diagrams for constraint handling in test case generation 
Sub Title (in English)  
Keyword(1) Combinatorial interaction testing  
Keyword(2) constraint handling  
Keyword(3) constraints  
Keyword(4) binary decision diagrams  
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1st Author's Name Tatsuhiro Tsuchiya  
1st Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2015-06-16 16:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2015-21 
Volume (vol) vol.115 
Number (no) no.86 
Page pp.31-34 
#Pages 4 
Date of Issue 2015-06-09 (DC) 

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