Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2015-08-05 10:45
Testbeds of a Highly Reliable Method for CANs in High Electromagnetic Environments
Muneyuki Nakamura, Mamoru Ohara (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Aromhack Saysanasongkham, Kazuya Sakai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2015-26 DC2015-22
Abstract (in Japanese) (See Japanese page) 
(in English) In controller area networks (CANs) on the modern electronic vehicles (EVs) and hybrid vehicles (HVs), the noise level caused by high voltage switching in DC-DC converters could be very large. On the basis of noise injection experiments using DC-DC converters, we propose an application layer-based hybrid ARQ protocol, which consists of the automatic repeat request (ARQ), forward error correction (FEC), and HALT modes. This protocol transitions to each mode by referring to the transmission and reception error counter incorporated in the CAN node. This paper indicates that the bus occupation rate per frame is less than the CAN protocol by performing the experiment using a noise injector and CAN node that implements the proposed protocol.
Keyword (in Japanese) (See Japanese page) 
(in English) CAN / DC-DC converter / switching noise / hybrid ARQ / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 175, DC2015-22, pp. 1-8, Aug. 2015.
Paper # DC2015-22 
Date of Issue 2015-07-28 (CPSY), 2015-07-29 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPSY2015-26 DC2015-22

Conference Information
Committee CPSY DC IPSJ-ARC  
Conference Date 2015-08-04 - 2015-08-06 
Place (in Japanese) (See Japanese page) 
Place (in English) B-Con Plaza (Beppu) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Parallel, Distributed and Cooperative Processing 
Paper Information
Registration To DC 
Conference Code 2015-08-CPSY-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Testbeds of a Highly Reliable Method for CANs in High Electromagnetic Environments 
Sub Title (in English)  
Keyword(1) CAN  
Keyword(2) DC-DC converter  
Keyword(3) switching noise  
Keyword(4) hybrid ARQ  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Muneyuki Nakamura  
1st Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
2nd Author's Name Mamoru Ohara  
2nd Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
3rd Author's Name Masayuki Arai  
3rd Author's Affiliation Nihon University (Nihon Univ.)
4th Author's Name Aromhack Saysanasongkham  
4th Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
5th Author's Name Kazuya Sakai  
5th Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
6th Author's Name Satoshi Fukumoto  
6th Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2015-08-05 10:45:00 
Presentation Time 30 minutes 
Registration for DC 
Paper # CPSY2015-26, DC2015-22 
Volume (vol) vol.115 
Number (no) no.174(CPSY), no.175(DC) 
Page pp.129-136(CPSY), pp.1-8(DC) 
#Pages 8 
Date of Issue 2015-07-28 (CPSY), 2015-07-29 (DC) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan